Discussion: “In-Situ Nanoindentation Hardness Apparatus for Mechanical Characterization of Extremely Thin Films” (Bhushan, B., Williams, V. S., and Shack, R. V., 1988, ASME J. Tribol., 110, pp. 563–571)Source: Journal of Tribology:;1988:;volume( 110 ):;issue: 003::page 571Author:P. E. Wierenga
DOI: 10.1115/1.3261686Publisher: The American Society of Mechanical Engineers (ASME)keyword(s): Thin films AND Nanoindentation ,
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contributor author | P. E. Wierenga | |
date accessioned | 2017-05-08T23:28:30Z | |
date available | 2017-05-08T23:28:30Z | |
date copyright | July, 1988 | |
date issued | 1988 | |
identifier issn | 0742-4787 | |
identifier other | JOTRE9-28471#571_1.pdf | |
identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/104616 | |
publisher | The American Society of Mechanical Engineers (ASME) | |
title | Discussion: “In-Situ Nanoindentation Hardness Apparatus for Mechanical Characterization of Extremely Thin Films” (Bhushan, B., Williams, V. S., and Shack, R. V., 1988, ASME J. Tribol., 110, pp. 563–571) | |
type | Journal Paper | |
journal volume | 110 | |
journal issue | 3 | |
journal title | Journal of Tribology | |
identifier doi | 10.1115/1.3261686 | |
journal fristpage | 571 | |
identifier eissn | 1528-8897 | |
keywords | Thin films AND Nanoindentation | |
tree | Journal of Tribology:;1988:;volume( 110 ):;issue: 003 | |
contenttype | Fulltext |