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    Discussion: “In-Situ Nanoindentation Hardness Apparatus for Mechanical Characterization of Extremely Thin Films” (Bhushan, B., Williams, V. S., and Shack, R. V., 1988, ASME J. Tribol., 110, pp. 563–571)

    Source: Journal of Tribology:;1988:;volume( 110 ):;issue: 003::page 571
    Author:
    P. E. Wierenga
    DOI: 10.1115/1.3261686
    Publisher: The American Society of Mechanical Engineers (ASME)
    keyword(s): Thin films AND Nanoindentation ,
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      Discussion: “In-Situ Nanoindentation Hardness Apparatus for Mechanical Characterization of Extremely Thin Films” (Bhushan, B., Williams, V. S., and Shack, R. V., 1988, ASME J. Tribol., 110, pp. 563–571)

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    http://yetl.yabesh.ir/yetl1/handle/yetl/104616
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    contributor authorP. E. Wierenga
    date accessioned2017-05-08T23:28:30Z
    date available2017-05-08T23:28:30Z
    date copyrightJuly, 1988
    date issued1988
    identifier issn0742-4787
    identifier otherJOTRE9-28471#571_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/104616
    publisherThe American Society of Mechanical Engineers (ASME)
    titleDiscussion: “In-Situ Nanoindentation Hardness Apparatus for Mechanical Characterization of Extremely Thin Films” (Bhushan, B., Williams, V. S., and Shack, R. V., 1988, ASME J. Tribol., 110, pp. 563–571)
    typeJournal Paper
    journal volume110
    journal issue3
    journal titleJournal of Tribology
    identifier doi10.1115/1.3261686
    journal fristpage571
    identifier eissn1528-8897
    keywordsThin films AND Nanoindentation
    treeJournal of Tribology:;1988:;volume( 110 ):;issue: 003
    contenttypeFulltext
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