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contributor authorE. Suhir
date accessioned2017-05-08T23:26:21Z
date available2017-05-08T23:26:21Z
date copyrightDecember, 1988
date issued1988
identifier issn0021-8936
identifier otherJAMCAV-26299#818_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/103430
description abstractCompliant external electrical leads are often utilized as strain buffers in surface-mounted device technology to provide the necessary stress relief for the device, when the substrate is subjected to bending. A paradoxical situation was observed, however, during testing of compliant leaded hybrid integrated circuits (HIC): In some tests the bending moment, applied to the printed wire board (PWB) and causing HIC fracture, turned out smaller (not greater), when leads of greater compliance were installed. We show that such a paradoxical situation is due to the redistribution of lead reactions at certain combinations of HIC length, HIC and PWB flexural rigidity, and spring constant of the elastic attachment. Our analysis has indicated, that only sufficiently compliant leads can essentially reduce the stresses, while leads of moderate compliance can result in even greater stresses in the HIC than stiff leads. We suggest an easy-to-calculate governing parameter, which characterizes the mechanical behavior of HIC/PWB and similar assemblies with compliant attachments.
publisherThe American Society of Mechanical Engineers (ASME)
titleOn a Paradoxical Phenomenon Related to Beams on Elastic Foundation: Could External Compliant Leads Reduce the Strength of a Surface-Mounted Device?
typeJournal Paper
journal volume55
journal issue4
journal titleJournal of Applied Mechanics
identifier doi10.1115/1.3173727
journal fristpage818
journal lastpage821
identifier eissn1528-9036
keywordsWire
keywordsStress
keywordsPolishing equipment
keywordsFracture (Process)
keywordsMechanical behavior
keywordsTesting
keywordsElastic constants
keywordsIntegrated circuits
keywordsStiffness AND Printed circuit boards
treeJournal of Applied Mechanics:;1988:;volume( 055 ):;issue: 004
contenttypeFulltext


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