YaBeSH Engineering and Technology Library

    • Journals
    • PaperQuest
    • YSE Standards
    • YaBeSH
    • Login
    Search 
    •   YE&T Library
    • Search
    •   YE&T Library
    • Search
    • All Fields
    • Source Title
    • Year
    • Publisher
    • Title
    • Subject
    • Author
    • DOI
    • ISBN
    Advanced Search
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    Search

    Show Advanced FiltersHide Advanced Filters

    Filters

    Use filters to refine the search results.

    Now showing items 1-3 of 3

    • Relevance
    • Title Asc
    • Title Desc
    • Year Asc
    • Year Desc
    • 5
    • 10
    • 20
    • 40
    • 60
    • 80
    • 100
  • Export
    • CSV
    • RIS
    • Sort Options:
    • Relevance
    • Title Asc
    • Title Desc
    • Issue Date Asc
    • Issue Date Desc
    • Results Per Page:
    • 5
    • 10
    • 20
    • 40
    • 60
    • 80
    • 100

    Fatigue Lives on 60Sn/40Pb Solder Joints Made With Different Cooling Rates 

    Source: Journal of Electronic Packaging:;1992:;volume( 114 ):;issue: 002:;page 104
    Author(s): Z. Mei; J. W. Morris
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This paper reports the results of a study on the effect of the cooling rate during solidification on the isothermal shear-fatigue life of 60Sn/40Pb solder joints. Solder joints are made with ...
    Request PDF

    Superplastic Creep of Eutectic Tin-Lead Solder Joints 

    Source: Journal of Electronic Packaging:;1991:;volume( 113 ):;issue: 002:;page 109
    Author(s): Z. Mei; M. C. Shine; J. W. Morris
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The creep behavior of air-cooled and liquid nitrogen-quenched soldered joints of 60/40 Sn-Pb at 65°C has been studied. The stress exponent, n, in the power law, γ̇ (steady state strain ...
    Request PDF

    Creep Analysis and Thermal-Fatigue Life Prediction of the Lead-Free Solder Sealing Ring of a Photonic Switch 

    Source: Journal of Electronic Packaging:;2002:;volume( 124 ):;issue: 004:;page 403
    Author(s): J. Lau; Z. Mei; S. Pang; C. Amsden; J. Rayner; S. Pan
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Thermal reliability of the solder sealing ring of Agilent Technologies’ bubble-actuated photonic cross-connect switches has been investigated in this paper. Emphasis is placed on the determination ...
    Request PDF
    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian
     

    Author

    Publisher

    Year

    Type

    Content Type

    Publication Title

    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian