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    Unbalanced Hydraulic Forces Caused by Geometrical Manufacturing Deviations of Centrifugal Impellers 

    Source: Journal of Fluids Engineering:;1998:;volume( 120 ):;issue: 003:;page 531
    Author(s): Yoshiki Yoshida; Takashi Kawakami; Toru Sakatani; Yoshinobu Tsujimoto
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: When an impeller has geometrical manufacturing deviations, synchronous vibration occurs from an unbalanced hydraulic force rotating with the impeller. This phenomenon is termed “Hydraulic unbalance.” ...
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    Strength Evaluation of Notch Structure for Semiconductor Encapsulant Resin 

    Source: Journal of Electronic Packaging:;2002:;volume( 124 ):;issue: 004:;page 323
    Author(s): Noriyasu Kawamura; Kikuo Kishimoto; Toshikazu Shibuya; Masaki Omiya; Takashi Kawakami
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Plastic encapsulated semiconductor packages may crack at the corner regions of die pads or chips if internal delamination occurs at an elevated temperature during the reflow soldering process. ...
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    Field Study on Pump Vibration and ISO’s New Criteria 

    Source: Journal of Fluids Engineering:;1999:;volume( 121 ):;issue: 004:;page 798
    Author(s): Toshiyuki Osada; Takashi Kawakami; Tadashi Yokoi; Yoshinobu Tsujimoto
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: ISO 10816-3 (a new standard of International Organization for Standardization) was established as vibration criteria for industrial rotating machinery based on the bearing housing vibration in ...
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    Thermal Stresses of Through Silicon Vias and Si Chips in Three Dimensional System in Package 

    Source: Journal of Electronic Packaging:;2012:;volume( 134 ):;issue: 002:;page 20903
    Author(s): Keiji Matsumoto; Takahiro Kinoshita; Takashi Kawakami; Sayuri Kohara; Yasumitsu Orii; Tatsuhiro Hori; Fumiaki Yamada; Morihiro Kada
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Thermal conduction and mechanical stresses in through silicon via (TSV) structures in three dimensional system in package (3D SiP) under device operation condition were discussed. A large scale ...
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