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Optical Metrology of Critical Dimensions in Large-Area Nanostructure Arrays With Complex Patterns
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: It was recently demonstrated that scatterometry-based metrology has the capability to perform high-throughput metrology on large-area nanopatterned surfaces. However, the way this approach is currently pursued requires an ...
Scalable Au Metal-Assisted Chemical Etch Nanopatterning Using Enhanced Metal Break Techniques
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: This paper presents catalyst patterning techniques for promoting wafer-scale uniformity while producing taper-free high aspect ratio Si nanostructures using gold (Au) metal-assisted chemical etch (MacEtch). Typical Au ...
Mechanics Based Approach for Detection and Measurement of Particle Contamination in Proximity Nanofabrication Processes
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: In spite of the great progress made toward addressing the challenge of particle contamination in nanomanufacturing, its deleterious effect on yield is still not negligible. This is particularly true for nanofabrication ...
Scalable Fabrication of Low Elastic Modulus Polymeric Nanocarriers With Controlled Shapes for Diagnostics and Drug Delivery
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: A new process, decoupled functional imprint lithography (DFIL), is presented for fabricating low elastic modulus polymeric nanocarriers possessing Young's modulus of bulk material as low as sub1 MPa. This method is ...
Size Dependent Nanoparticle Uptake by Endothelial Cells in a Capillary Flow System
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: An in vitro cell culture system is developed for studying the uptake characteristics of nanoparticles (NPs) by endothelial cells under shear stress. Results show that the smaller polystyrene nanospheres are uptaken more ...
Metal Assisted Chemical Etch of Polycrystalline Silicon
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Metalassisted chemical etching (MacEtch) of silicon shows reliable vertical anisotropic wet etching only in singlecrystal silicon, which limits its applications to a small number of devices. This work extends the capabilities ...
Spectral Imaging and Computer Vision for High-Throughput Defect Detection and Root-Cause Analysis of Silicon Nanopillar Arrays
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Far-field spectral imaging, coupled with computer vision methods, is demonstrated as an effective inspection method for detection, classification, and root-cause analysis of manufacturing defects in large area Si nanopillar ...