YaBeSH Engineering and Technology Library

    • Journals
    • PaperQuest
    • YSE Standards
    • YaBeSH
    • Login
    Search 
    •   YE&T Library
    • Search
    •   YE&T Library
    • Search
    • All Fields
    • Source Title
    • Year
    • Publisher
    • Title
    • Subject
    • Author
    • DOI
    • ISBN
    Advanced Search
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    Search

    Show Advanced FiltersHide Advanced Filters

    Filters

    Use filters to refine the search results.

    Now showing items 1-8 of 8

    • Relevance
    • Title Asc
    • Title Desc
    • Year Asc
    • Year Desc
    • 5
    • 10
    • 20
    • 40
    • 60
    • 80
    • 100
  • Export
    • CSV
    • RIS
    • Sort Options:
    • Relevance
    • Title Asc
    • Title Desc
    • Issue Date Asc
    • Issue Date Desc
    • Results Per Page:
    • 5
    • 10
    • 20
    • 40
    • 60
    • 80
    • 100

    Optical Metrology of Critical Dimensions in Large-Area Nanostructure Arrays With Complex Patterns 

    Source: Journal of Manufacturing Science and Engineering:;2023:;volume( 145 ):;issue: 006:;page 61010-1
    Author(s): Sabbagh, Ramin; Stothert, Alec; Sreenivasan, S. V.; Djurdjanovic, Dragan
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: It was recently demonstrated that scatterometry-based metrology has the capability to perform high-throughput metrology on large-area nanopatterned surfaces. However, the way this approach is currently pursued requires an ...
    Request PDF

    Scalable Au Metal-Assisted Chemical Etch Nanopatterning Using Enhanced Metal Break Techniques 

    Source: Journal of Micro and Nano-Manufacturing:;2024:;volume( 011 ):;issue: 001:;page 11005-1
    Author(s): Hrdy, Mark; Mallavarapu, Akhila; Castañeda, Mariana; Ajay, Paras; Sreenivasan, S. V.
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This paper presents catalyst patterning techniques for promoting wafer-scale uniformity while producing taper-free high aspect ratio Si nanostructures using gold (Au) metal-assisted chemical etch (MacEtch). Typical Au ...
    Request PDF

    Mechanics Based Approach for Detection and Measurement of Particle Contamination in Proximity Nanofabrication Processes 

    Source: Journal of Micro and Nano-Manufacturing:;2016:;volume( 004 ):;issue: 003:;page 31004
    Author(s): Singhal, Shrawan; Grigas, Michelle A.; Sreenivasan, S. V.
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: In spite of the great progress made toward addressing the challenge of particle contamination in nanomanufacturing, its deleterious effect on yield is still not negligible. This is particularly true for nanofabrication ...
    Request PDF

    Harnessing Fly Ash as Particle Reinforcement in Nature-Inspired Multilayer Composites 

    Source: Journal of Micro and Nano Science and Engineering:;2024:;volume( 012 ):;issue: 001:;page 11002-1
    Author(s): Patadiya, Jigar; Sreenivasan, S.; Yadav, Ramdayal; Naebe, Minoo; Kandasubramanian, Balasubramanian
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Strategies for strengthening the characteristics of naturally inspired multilayer composites are being sought, including inorganic platelet alignment, enhancing interlaminar collaboration between polymeric solution and ...
    Request PDF

    Scalable Fabrication of Low Elastic Modulus Polymeric Nanocarriers With Controlled Shapes for Diagnostics and Drug Delivery 

    Source: Journal of Micro and Nano-Manufacturing:;2015:;volume( 003 ):;issue: 001:;page 11002
    Author(s): Singh, Vikramjit; Agarwal, Rachit; Jurney, Patrick; Marshall, Kervin; Roy, Krishnendu; Shi, Li; Sreenivasan, S.V.
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: A new process, decoupled functional imprint lithography (DFIL), is presented for fabricating low elastic modulus polymeric nanocarriers possessing Young's modulus of bulk material as low as sub1 MPa. This method is ...
    Request PDF

    Size Dependent Nanoparticle Uptake by Endothelial Cells in a Capillary Flow System 

    Source: Journal of Nanotechnology in Engineering and Medicine:;2015:;volume( 006 ):;issue: 001:;page 11007
    Author(s): Jurney, Patrick; Agarwal, Rachit; Roy, Krishnendu; Sreenivasan, S. V.; Shi, Li
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: An in vitro cell culture system is developed for studying the uptake characteristics of nanoparticles (NPs) by endothelial cells under shear stress. Results show that the smaller polystyrene nanospheres are uptaken more ...
    Request PDF

    Metal Assisted Chemical Etch of Polycrystalline Silicon 

    Source: Journal of Micro and NanoManufacturing:;2022:;volume( 010 ):;issue: 002:;page 21002
    Author(s): Barrera, Crystal;Ajay, Paras;Mallavarapu, Akhila;Hrdy, Mark;Sreenivasan, S. V.
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Metalassisted chemical etching (MacEtch) of silicon shows reliable vertical anisotropic wet etching only in singlecrystal silicon, which limits its applications to a small number of devices. This work extends the capabilities ...
    Request PDF

    Spectral Imaging and Computer Vision for High-Throughput Defect Detection and Root-Cause Analysis of Silicon Nanopillar Arrays 

    Source: Journal of Micro and Nano-Manufacturing:;2021:;volume( 009 ):;issue: 001:;page 010904-1
    Author(s): Gawlik, Brian; Barr, Ariel R.; Mallavarapu, Akhila; Yu, Edward T.; Sreenivasan, S. V.
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Far-field spectral imaging, coupled with computer vision methods, is demonstrated as an effective inspection method for detection, classification, and root-cause analysis of manufacturing defects in large area Si nanopillar ...
    Request PDF
    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian
     

    Author

    ... View More

    Publisher

    Year

    Type

    Content Type

    Publication Title

    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian