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    Shearing Deformation in Partial Areal Arrays: Analytical Results 

    Source: Journal of Electronic Packaging:;1998:;volume( 120 ):;issue: 001:;page 18
    Author(s): S. M. Heinrich; P. S. Lee; S. Shakya
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Simple, closed-form expressions, based on elasticity theory, are derived for determining the location and magnitude of the maximum shearing displacement in a partial areal array of solder joints. ...
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    Effect of Component Heterogeneity on Global CTE Mismatch Displacement in Areal-Array Solder Interconnects 

    Source: Journal of Electronic Packaging:;1998:;volume( 120 ):;issue: 001:;page 12
    Author(s): S. M. Heinrich; P. S. Lee; S. Shakya
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: An analytical model is developed for the problem of a thermally loaded electronic assembly consisting of a nonhomogeneous component attached to a substrate by means of an areal array of solder ...
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    An Improved Analytical Model for Time-Dependent Shearing Deformation in Area-Array Interconnects 

    Source: Journal of Electronic Packaging:;2004:;volume( 126 ):;issue: 001:;page 74
    Author(s): S. Shakya; S. M. Heinrich; P. S. Lee
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: An improved time-dependent analytical model is developed for predicting the maximum shearing displacement in an area-array electronic assembly under global thermal mismatch loading. The thermal ...
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    Improved Analytical Estimate of Global CTE Mismatch Displacement in Areal-Array Solder Joints 

    Source: Journal of Electronic Packaging:;1997:;volume( 119 ):;issue: 004:;page 218
    Author(s): S. M. Heinrich; P. S. Lee; S. Shakya
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: An analytical expression is derived for determining the maximum solder joint shearing displacement occurring in an a real-array interconnect under global CTE mismatch loading. The result may be ...
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    An Analytical Model for Time-Dependent Shearing Deformation in Area-Array Interconnects 

    Source: Journal of Electronic Packaging:;2000:;volume( 122 ):;issue: 004:;page 328
    Author(s): S. M. Heinrich; J. Liang; P. S. Lee; S. Shakya
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: An analytical model is developed for predicting the time-dependent shearing displacement in area-array solder interconnects due to global CTE mismatch under thermal cycling. As a first step toward ...
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