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    Mechanical Testing for Stretchable Electronics 

    Source: Journal of Electronic Packaging:;2017:;volume( 139 ):;issue: 002:;page 20905
    Author(s): Klein, Steven A.; Aleksov, Aleksandar; Subramanian, Vijay; Malatkar, Pramod; Mahajan, Ravi
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Stretchable electronics have been a subject of increased research over the past decade (Lacour, S., et al., 2006, “Mechanisms of Reversible Stretchability of Thin Metal Films on Elastomeric Substrates,” Appl. Phys. Lett., ...
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    Characterization of Bulk and Thin Film Fracture in Electronic Packaging 

    Source: Journal of Electronic Packaging:;2017:;volume( 139 ):;issue: 002:;page 20912
    Author(s): Subramanian, Vijay; Yazzie, Kyle; Alazar, Tsgereda; Penmecha, Bharat; Liu, Pilin; Bai, Yiqun; Malatkar, Pramod
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: As semiconductor packaging technologies continue to scale, it drives the use of existing and new materials in thin layer form factors. Increasing packaging complexity implies that materials in thin layers are subject to ...
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    Vibration-Induced Failures in Automotive Electronics: Knowledge-Based Qualification Perspective 

    Source: Journal of Electronic Packaging:;2018:;volume( 140 ):;issue: 002:;page 20905
    Author(s): Meyyappan, Karumbu; Vujosevic, Milena; Wu, Qifeng; Malatkar, Pramod; Hill, Charles; Parrott, Ryan
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This paper intends to address an important gap between reliability standards and the physics of how components respond to real use conditions using a knowledge-based qualification (KBQ) process. Bridging the gap is essential ...
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    High-Temperature Interfacial Adhesion Strength Measurement in Electronic Packaging Using the Double Cantilever Beam Method 

    Source: Journal of Electronic Packaging:;2017:;volume( 139 ):;issue: 002:;page 20902
    Author(s): Sankarasubramanian, Santosh; Cruz, Jaime; Yazzie, Kyle; Sundar, Vaasavi; Subramanian, Vijay; Alazar, Tsgereda; Yagnamurthy, Sivakumar; Cetegen, Edvin; McCoy, David; Malatkar, Pramod
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: This paper describes the use of the double cantilever beam (DCB) method for characterizing the adhesion strength of interfaces in advanced microelectronic packages at room and high temperatures. Those interfaces include ...
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    Mechanical Characterization of Thermal Interface Materials and Its Challenges 

    Source: Journal of Electronic Packaging:;2019:;volume( 141 ):;issue: 001:;page 10804
    Author(s): Subramanian, Vijay; Sanchez, Jorge; Bautista, Joseph; He, Yi; Wang, Jinlin; Das, Abhishek; Schuldes, Jesus Gerardo Reyes; Yazzie, Kyle; Dhavaleswarapu, Hemanth K.; Malatkar, Pramod
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Thermal interface materials (TIMs) play a vital role in the performance of electronic packages by enabling improved heat dissipation. These materials typically have high thermal conductivity and are designed to offer a ...
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    Mechanical Characterization of Thermal Interface Materials and Its Challenges 

    Source: Journal of Electronic Packaging:;2019:;volume( 141 ):;issue: 001:;page 10804
    Author(s): Subramanian, Vijay; Sanchez, Jorge; Bautista, Joseph; He, Yi; Wang, Jinlin; Das, Abhishek; Schuldes, Jesus Gerardo Reyes; Yazzie, Kyle; Dhavaleswarapu, Hemanth K.; Malatkar, Pramod
    Publisher: American Society of Mechanical Engineers (ASME)
    Abstract: Thermal interface materials (TIMs) play a vital role in the performance of electronic packages by enabling improved heat dissipation. These materials typically have high thermal conductivity and are designed to offer a ...
    Request PDF
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