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    A Note on Suhir’s Solution of Thermal Stresses for a Die-Substrate Assembly 

    Source: Journal of Electronic Packaging:;2004:;volume( 126 ):;issue: 001:;page 115
    Author(s): M. Y. Tsai; C. H. Hsu; C. N. Han
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The well-known, closed-form solution to thermal stresses of a die-substrate assembly is initially provided by Suhir in the mid-1980’s after Timoshenko [1] and Chen and Nelson [2]. It has been ...
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    Test Methods for Silicon Die Strength 

    Source: Journal of Electronic Packaging:;2006:;volume( 128 ):;issue: 004:;page 419
    Author(s): M. Y. Tsai; C. H. Chen; C. S. Lin
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Recently, the 3D or stacked-die packages become increasingly popular for packaging ICs into a system or subsystem to satisfy the needs of low cost, small form factor, and high performance. For ...
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    DSpace software copyright © 2002-2015  DuraSpace
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