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RISThermal Conductivity Measurements on Polycrystalline Silicon Microbridges Using the 3ω Technique
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: The thermal performance of microelectromechanical systems devices is governed by the structure and composition of the constituent materials as well as the geometrical design. With the continued ...
Re-examining Electron-Fermi Relaxation in Gold Films With a Nonlinear Thermoreflectance Model
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: In this work, we examine Fermi relaxation in 20 nm Au films with pump-probe themoreflectance using a thin film, intraband thermoreflectance model. Our results indicate that the Fermi relaxation ...
Criteria for Cross-Plane Dominated Thermal Transport in Multilayer Thin Film Systems During Modulated Laser Heating
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Pump-probe transient thermoreflectance (TTR) techniques are powerful tools for measuring the thermophysical properties of thin films, such as thermal conductivity, Λ, or thermal boundary conductance, ...
Raman Thermometry Measurements and Thermal Simulations for MEMS Bridges at Pressures From 0.05 Torr to 625 Torr
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: This paper reports on experimental and computational investigations into the thermal performance of microelectromechanical systems (MEMS) as a function of the pressure of the surrounding gas. High ...
Measuring the Thermal Conductivity of Porous, Transparent SiO2 Films With Time Domain Thermoreflectance
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Nanocomposites offer unique capabilities of controlling thermal transport through the manipulation of various structural aspects of the material. However, measurements of the thermal properties of ...