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    Development of an Integrated Design System for Thermal Reliability Prediction of SMT Solder Interconnects 

    Source: Journal of Electronic Packaging:;1996:;volume( 118 ):;issue: 004:;page 235
    Author(s): Y.-H. Pao; E. Jih; V. Siddapureddy
    Publisher: The American Society of Mechanical Engineers (ASME)
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    Thermal Fatigue Damage in the Solder Joints of Leadless Chip Resistors 

    Source: Journal of Electronic Packaging:;1994:;volume( 116 ):;issue: 002:;page 83
    Author(s): R. K. Govila; E. Jih; Y.-H. Pao; C. Larner
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Leadless chip resistors (LCR) made by two different manufacturers and surface mounted on glass/epoxy printed circuit board (PCB) were subjected to thermal cycling between −55°C to 125°C ...
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    Determination of Fracture Toughness of Thermally Conductive Adhesives 

    Source: Journal of Electronic Packaging:;1997:;volume( 119 ):;issue: 003:;page 204
    Author(s): E. Jih; X. Song; C. Larner; Y.-H. Pao
    Publisher: The American Society of Mechanical Engineers (ASME)
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    Constitutive Behavior and Low Cycle Thermal Fatigue of 97Sn-3Cu Solder Joints 

    Source: Journal of Electronic Packaging:;1993:;volume( 115 ):;issue: 002:;page 147
    Author(s): Y.-H. Pao; J. Browning; S. Badgley; E. Jih; R. Govila
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The thermal cyclic shear stress/strain hysteresis response and associated steady-state creep parameters of 97Sn-3Cu solder joints have been determined using a beam specimen previously developed by ...
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