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Experimental Study on Electric-Current Induced Damage Evolution at the Crack Tip in Thin Film Conductors
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: The time dependent temperature distribution induced by electric current heating in a double edge cracked, unpassivated thin aluminum or gold film interconnect lines is monitored using a high ...
Thermal Strain Measurements in Electronic Packages Through Fractional Fringe Moiré Interferometry
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Fractional Fringe Moiré Interferometry (FFMI)—a new experimental methodology to measure accurately deformations and consequently strains—has been successfully implemented to determine thermally induced ...
Mechanistic Understanding of Material Detachment During Micro-Scale Polishing
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: A combined experimental and modeling approach has been devised to understand the material removal mechanism during abrasion of ductile copper discs. First, single grit scratch intersection experiments ...