Diameter Gage for Use at Elevated Temperatures and Intermediate Tensile Strain RatesSource: Journal of Engineering Materials and Technology:;1974:;volume( 096 ):;issue: 003::page 195Author:T. A. Jur
DOI: 10.1115/1.3443210Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: A diameter gage is described which has been used to obtain true stress-true strain data at elevated temperatures. The device is capable of continuously and automatically measuring diameter of a tensile specimen to a true strain as high as 0.90–0.95. Data are presented which demonstrate the ability of the gage to identify conditions of non-uniform deformation behavior.
keyword(s): Temperature , Gages , Stress AND Deformation ,
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| contributor author | T. A. Jur | |
| date accessioned | 2017-05-09T01:38:12Z | |
| date available | 2017-05-09T01:38:12Z | |
| date copyright | July, 1974 | |
| date issued | 1974 | |
| identifier issn | 0094-4289 | |
| identifier other | JEMTA8-26837#195_1.pdf | |
| identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/164808 | |
| description abstract | A diameter gage is described which has been used to obtain true stress-true strain data at elevated temperatures. The device is capable of continuously and automatically measuring diameter of a tensile specimen to a true strain as high as 0.90–0.95. Data are presented which demonstrate the ability of the gage to identify conditions of non-uniform deformation behavior. | |
| publisher | The American Society of Mechanical Engineers (ASME) | |
| title | Diameter Gage for Use at Elevated Temperatures and Intermediate Tensile Strain Rates | |
| type | Journal Paper | |
| journal volume | 96 | |
| journal issue | 3 | |
| journal title | Journal of Engineering Materials and Technology | |
| identifier doi | 10.1115/1.3443210 | |
| journal fristpage | 195 | |
| journal lastpage | 200 | |
| identifier eissn | 1528-8889 | |
| keywords | Temperature | |
| keywords | Gages | |
| keywords | Stress AND Deformation | |
| tree | Journal of Engineering Materials and Technology:;1974:;volume( 096 ):;issue: 003 | |
| contenttype | Fulltext |