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    Nanoindentation of Compliant Substrate Systems: Effects of Geometry and Compliance

    Source: Journal of Engineering Materials and Technology:;2010:;volume( 132 ):;issue: 002::page 21001
    Author:
    Thao D. Nguyen
    ,
    J. D. Yeager
    ,
    D. P. Adams
    ,
    N. R. Moody
    ,
    D. F. Bahr
    DOI: 10.1115/1.4000230
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Nanoindentation is widely used to characterize the mechanical and interfacial properties of thin film systems. However, the effects of substrate compliance on the indentation response of compliant substrate systems are not well understood. This paper investigates the effects of the large compliance mismatch between the film and the substrate and of the film thickness for model systems using nanoindentation tests, finite element simulations, and an analytical model based on a classical plate-bending solution. The results showed that for displacements less than the film thickness and for ratio of the substrate to film modulus less than 100. The indentation force-displacement response exhibits a linear relationship that can be predicted accurately by the linear plate-bending model. The effective stiffness depends linearly on the film thickness and also on the substrate and film moduli. For larger displacements, the indentation response exhibits the scaling relationship of the nonlinear plate-bending model.
    keyword(s): Finite element analysis , Displacement , Film thickness , Force , Nanoindentation , Stiffness , Engineering simulation , Finite element model , Geometry AND Thin films ,
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      Nanoindentation of Compliant Substrate Systems: Effects of Geometry and Compliance

    URI
    https://yetl.yabesh.ir/yetl1/handle/yetl/143346
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    contributor authorThao D. Nguyen
    contributor authorJ. D. Yeager
    contributor authorD. P. Adams
    contributor authorN. R. Moody
    contributor authorD. F. Bahr
    date accessioned2017-05-09T00:37:58Z
    date available2017-05-09T00:37:58Z
    date copyrightApril, 2010
    date issued2010
    identifier issn0094-4289
    identifier otherJEMTA8-27128#021001_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/143346
    description abstractNanoindentation is widely used to characterize the mechanical and interfacial properties of thin film systems. However, the effects of substrate compliance on the indentation response of compliant substrate systems are not well understood. This paper investigates the effects of the large compliance mismatch between the film and the substrate and of the film thickness for model systems using nanoindentation tests, finite element simulations, and an analytical model based on a classical plate-bending solution. The results showed that for displacements less than the film thickness and for ratio of the substrate to film modulus less than 100. The indentation force-displacement response exhibits a linear relationship that can be predicted accurately by the linear plate-bending model. The effective stiffness depends linearly on the film thickness and also on the substrate and film moduli. For larger displacements, the indentation response exhibits the scaling relationship of the nonlinear plate-bending model.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleNanoindentation of Compliant Substrate Systems: Effects of Geometry and Compliance
    typeJournal Paper
    journal volume132
    journal issue2
    journal titleJournal of Engineering Materials and Technology
    identifier doi10.1115/1.4000230
    journal fristpage21001
    identifier eissn1528-8889
    keywordsFinite element analysis
    keywordsDisplacement
    keywordsFilm thickness
    keywordsForce
    keywordsNanoindentation
    keywordsStiffness
    keywordsEngineering simulation
    keywordsFinite element model
    keywordsGeometry AND Thin films
    treeJournal of Engineering Materials and Technology:;2010:;volume( 132 ):;issue: 002
    contenttypeFulltext
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