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contributor authorThao D. Nguyen
contributor authorJ. D. Yeager
contributor authorD. P. Adams
contributor authorN. R. Moody
contributor authorD. F. Bahr
date accessioned2017-05-09T00:37:58Z
date available2017-05-09T00:37:58Z
date copyrightApril, 2010
date issued2010
identifier issn0094-4289
identifier otherJEMTA8-27128#021001_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/143346
description abstractNanoindentation is widely used to characterize the mechanical and interfacial properties of thin film systems. However, the effects of substrate compliance on the indentation response of compliant substrate systems are not well understood. This paper investigates the effects of the large compliance mismatch between the film and the substrate and of the film thickness for model systems using nanoindentation tests, finite element simulations, and an analytical model based on a classical plate-bending solution. The results showed that for displacements less than the film thickness and for ratio of the substrate to film modulus less than 100. The indentation force-displacement response exhibits a linear relationship that can be predicted accurately by the linear plate-bending model. The effective stiffness depends linearly on the film thickness and also on the substrate and film moduli. For larger displacements, the indentation response exhibits the scaling relationship of the nonlinear plate-bending model.
publisherThe American Society of Mechanical Engineers (ASME)
titleNanoindentation of Compliant Substrate Systems: Effects of Geometry and Compliance
typeJournal Paper
journal volume132
journal issue2
journal titleJournal of Engineering Materials and Technology
identifier doi10.1115/1.4000230
journal fristpage21001
identifier eissn1528-8889
keywordsFinite element analysis
keywordsDisplacement
keywordsFilm thickness
keywordsForce
keywordsNanoindentation
keywordsStiffness
keywordsEngineering simulation
keywordsFinite element model
keywordsGeometry AND Thin films
treeJournal of Engineering Materials and Technology:;2010:;volume( 132 ):;issue: 002
contenttypeFulltext


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