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    Development of Cutting Tool With Built-In Thin Film Thermocouples for Measuring High Temperature Fields in Metal Cutting Processes

    Source: Journal of Manufacturing Science and Engineering:;2008:;volume( 130 ):;issue: 003::page 34501
    Author:
    Jun Shinozuka
    ,
    Ali Basti
    ,
    Toshiyuki Obikawa
    DOI: 10.1115/1.2823066
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: In order to measure temperature fields on tool face during cutting, a cutting tool with built-in thin film thermocouples (TFTs) has been devised. The TFTs composed of a nickel and nichrome thin films were fabricated on the rake face near the cutting edge of a sintered alumina tool insert using a physical vapor deposition and photolithography technique. An empirical formula that shows Seebeck coefficient of a TFT depends on electrical resistance of the TFT circuit was established. Three different types of tools in number and size of TFTs were developed and temperature fields on the rake face in cutting of a plain carbon steel S45C were measured. The results of the cutting thermometry experiment reveal that the devised tool with built-in three TFTs can measure temperature fields on the tool face and can sense slight change in cutting situation.
    keyword(s): Thin films , Temperature , Temperature measurement , Cutting , Thermocouples , Thin film transistors , Cutting tools , Circuits , Electrical resistance , High temperature AND Metal cutting ,
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      Development of Cutting Tool With Built-In Thin Film Thermocouples for Measuring High Temperature Fields in Metal Cutting Processes

    URI
    https://yetl.yabesh.ir/yetl1/handle/yetl/138739
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    • Journal of Manufacturing Science and Engineering

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    contributor authorJun Shinozuka
    contributor authorAli Basti
    contributor authorToshiyuki Obikawa
    date accessioned2017-05-09T00:29:27Z
    date available2017-05-09T00:29:27Z
    date copyrightJune, 2008
    date issued2008
    identifier issn1087-1357
    identifier otherJMSEFK-28028#034501_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/138739
    description abstractIn order to measure temperature fields on tool face during cutting, a cutting tool with built-in thin film thermocouples (TFTs) has been devised. The TFTs composed of a nickel and nichrome thin films were fabricated on the rake face near the cutting edge of a sintered alumina tool insert using a physical vapor deposition and photolithography technique. An empirical formula that shows Seebeck coefficient of a TFT depends on electrical resistance of the TFT circuit was established. Three different types of tools in number and size of TFTs were developed and temperature fields on the rake face in cutting of a plain carbon steel S45C were measured. The results of the cutting thermometry experiment reveal that the devised tool with built-in three TFTs can measure temperature fields on the tool face and can sense slight change in cutting situation.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleDevelopment of Cutting Tool With Built-In Thin Film Thermocouples for Measuring High Temperature Fields in Metal Cutting Processes
    typeJournal Paper
    journal volume130
    journal issue3
    journal titleJournal of Manufacturing Science and Engineering
    identifier doi10.1115/1.2823066
    journal fristpage34501
    identifier eissn1528-8935
    keywordsThin films
    keywordsTemperature
    keywordsTemperature measurement
    keywordsCutting
    keywordsThermocouples
    keywordsThin film transistors
    keywordsCutting tools
    keywordsCircuits
    keywordsElectrical resistance
    keywordsHigh temperature AND Metal cutting
    treeJournal of Manufacturing Science and Engineering:;2008:;volume( 130 ):;issue: 003
    contenttypeFulltext
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