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contributor authorJun Shinozuka
contributor authorAli Basti
contributor authorToshiyuki Obikawa
date accessioned2017-05-09T00:29:27Z
date available2017-05-09T00:29:27Z
date copyrightJune, 2008
date issued2008
identifier issn1087-1357
identifier otherJMSEFK-28028#034501_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/138739
description abstractIn order to measure temperature fields on tool face during cutting, a cutting tool with built-in thin film thermocouples (TFTs) has been devised. The TFTs composed of a nickel and nichrome thin films were fabricated on the rake face near the cutting edge of a sintered alumina tool insert using a physical vapor deposition and photolithography technique. An empirical formula that shows Seebeck coefficient of a TFT depends on electrical resistance of the TFT circuit was established. Three different types of tools in number and size of TFTs were developed and temperature fields on the rake face in cutting of a plain carbon steel S45C were measured. The results of the cutting thermometry experiment reveal that the devised tool with built-in three TFTs can measure temperature fields on the tool face and can sense slight change in cutting situation.
publisherThe American Society of Mechanical Engineers (ASME)
titleDevelopment of Cutting Tool With Built-In Thin Film Thermocouples for Measuring High Temperature Fields in Metal Cutting Processes
typeJournal Paper
journal volume130
journal issue3
journal titleJournal of Manufacturing Science and Engineering
identifier doi10.1115/1.2823066
journal fristpage34501
identifier eissn1528-8935
keywordsThin films
keywordsTemperature
keywordsTemperature measurement
keywordsCutting
keywordsThermocouples
keywordsThin film transistors
keywordsCutting tools
keywordsCircuits
keywordsElectrical resistance
keywordsHigh temperature AND Metal cutting
treeJournal of Manufacturing Science and Engineering:;2008:;volume( 130 ):;issue: 003
contenttypeFulltext


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