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    Mechanical Approach to Nanomachining of Silicon Using Oxide Characteristics Based on Tribo Nanolithography (TNL) in KOH Solution

    Source: Journal of Manufacturing Science and Engineering:;2004:;volume( 126 ):;issue: 004::page 801
    Author:
    Jeong Woo Park
    ,
    Noritaka Kawasegi
    ,
    Noboru Morita
    ,
    Deug Woo Lee
    DOI: 10.1115/1.1811114
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The TNL (Tribo Nanolithography) method in aqueous solution uses the atomic force microscopy as a machining tool for the nanoscale fabrication of silicon. A specially designed cantilever with a diamond tip allows the formation of oxide patterns easily by a simple scratching process. A rectangular structure with a slope can be fabricated by a process in which a thin oxide layer rapidly forms in the substrate at the diamond-tip sample junction along the scanning path of the tip, and, simultaneously, the area uncovered with the oxide layer is being etched. Etching in KOH and HF is conducted to verify corrosion characteristics of oxide.
    keyword(s): Nanolithography , Diamonds , Etching , Silicon , Cantilevers , Atomic force microscopy AND Corrosion resistance ,
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      Mechanical Approach to Nanomachining of Silicon Using Oxide Characteristics Based on Tribo Nanolithography (TNL) in KOH Solution

    URI
    https://yetl.yabesh.ir/yetl1/handle/yetl/130348
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    • Journal of Manufacturing Science and Engineering

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    contributor authorJeong Woo Park
    contributor authorNoritaka Kawasegi
    contributor authorNoboru Morita
    contributor authorDeug Woo Lee
    date accessioned2017-05-09T00:13:35Z
    date available2017-05-09T00:13:35Z
    date copyrightNovember, 2004
    date issued2004
    identifier issn1087-1357
    identifier otherJMSEFK-27832#801_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/130348
    description abstractThe TNL (Tribo Nanolithography) method in aqueous solution uses the atomic force microscopy as a machining tool for the nanoscale fabrication of silicon. A specially designed cantilever with a diamond tip allows the formation of oxide patterns easily by a simple scratching process. A rectangular structure with a slope can be fabricated by a process in which a thin oxide layer rapidly forms in the substrate at the diamond-tip sample junction along the scanning path of the tip, and, simultaneously, the area uncovered with the oxide layer is being etched. Etching in KOH and HF is conducted to verify corrosion characteristics of oxide.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleMechanical Approach to Nanomachining of Silicon Using Oxide Characteristics Based on Tribo Nanolithography (TNL) in KOH Solution
    typeJournal Paper
    journal volume126
    journal issue4
    journal titleJournal of Manufacturing Science and Engineering
    identifier doi10.1115/1.1811114
    journal fristpage801
    journal lastpage806
    identifier eissn1528-8935
    keywordsNanolithography
    keywordsDiamonds
    keywordsEtching
    keywordsSilicon
    keywordsCantilevers
    keywordsAtomic force microscopy AND Corrosion resistance
    treeJournal of Manufacturing Science and Engineering:;2004:;volume( 126 ):;issue: 004
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
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