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contributor authorJeong Woo Park
contributor authorNoritaka Kawasegi
contributor authorNoboru Morita
contributor authorDeug Woo Lee
date accessioned2017-05-09T00:13:35Z
date available2017-05-09T00:13:35Z
date copyrightNovember, 2004
date issued2004
identifier issn1087-1357
identifier otherJMSEFK-27832#801_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/130348
description abstractThe TNL (Tribo Nanolithography) method in aqueous solution uses the atomic force microscopy as a machining tool for the nanoscale fabrication of silicon. A specially designed cantilever with a diamond tip allows the formation of oxide patterns easily by a simple scratching process. A rectangular structure with a slope can be fabricated by a process in which a thin oxide layer rapidly forms in the substrate at the diamond-tip sample junction along the scanning path of the tip, and, simultaneously, the area uncovered with the oxide layer is being etched. Etching in KOH and HF is conducted to verify corrosion characteristics of oxide.
publisherThe American Society of Mechanical Engineers (ASME)
titleMechanical Approach to Nanomachining of Silicon Using Oxide Characteristics Based on Tribo Nanolithography (TNL) in KOH Solution
typeJournal Paper
journal volume126
journal issue4
journal titleJournal of Manufacturing Science and Engineering
identifier doi10.1115/1.1811114
journal fristpage801
journal lastpage806
identifier eissn1528-8935
keywordsNanolithography
keywordsDiamonds
keywordsEtching
keywordsSilicon
keywordsCantilevers
keywordsAtomic force microscopy AND Corrosion resistance
treeJournal of Manufacturing Science and Engineering:;2004:;volume( 126 ):;issue: 004
contenttypeFulltext


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