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    Mechanical Characterization of the Heat Affected Zone of Gold Wirebonds Using Nanoindentation

    Source: Journal of Electronic Packaging:;2004:;volume( 126 ):;issue: 001::page 87
    Author:
    Mithilesh Shah
    ,
    Kaiyang Zeng
    ,
    Andrew A. O. Tay
    DOI: 10.1115/1.1648062
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The present work studies the mechanical properties of mechanically polished gold wire and wirebond using nanoindentation. Metallography of wirebond reveals undesirable coarse grain structure in HAZ due to recrystallization and grain growth. For our gold wire, the recrystallization temperature found using D.S.C. was 340.66°C and the dopants were identified using TOF-SIMS and hardness dependence on load was studied using nanoindentation. The nanoindentation of wirebond has confirmed a v-shaped hardness profile with minima at 166 μm along the HAZ. The elastic modulus varied independent of the microstructure. A yield stress profile based on empirical hardness-yield strength correlation is predicted for the wirebond.
    keyword(s): Wire , Recrystallization , Heat , Secondary ion mass spectrometry , Nanoindentation , Stress , Temperature , Polishing AND Mechanical properties ,
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      Mechanical Characterization of the Heat Affected Zone of Gold Wirebonds Using Nanoindentation

    URI
    https://yetl.yabesh.ir/yetl1/handle/yetl/129894
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    contributor authorMithilesh Shah
    contributor authorKaiyang Zeng
    contributor authorAndrew A. O. Tay
    date accessioned2017-05-09T00:12:45Z
    date available2017-05-09T00:12:45Z
    date copyrightMarch, 2004
    date issued2004
    identifier issn1528-9044
    identifier otherJEPAE4-26228#87_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/129894
    description abstractThe present work studies the mechanical properties of mechanically polished gold wire and wirebond using nanoindentation. Metallography of wirebond reveals undesirable coarse grain structure in HAZ due to recrystallization and grain growth. For our gold wire, the recrystallization temperature found using D.S.C. was 340.66°C and the dopants were identified using TOF-SIMS and hardness dependence on load was studied using nanoindentation. The nanoindentation of wirebond has confirmed a v-shaped hardness profile with minima at 166 μm along the HAZ. The elastic modulus varied independent of the microstructure. A yield stress profile based on empirical hardness-yield strength correlation is predicted for the wirebond.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleMechanical Characterization of the Heat Affected Zone of Gold Wirebonds Using Nanoindentation
    typeJournal Paper
    journal volume126
    journal issue1
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.1648062
    journal fristpage87
    journal lastpage93
    identifier eissn1043-7398
    keywordsWire
    keywordsRecrystallization
    keywordsHeat
    keywordsSecondary ion mass spectrometry
    keywordsNanoindentation
    keywordsStress
    keywordsTemperature
    keywordsPolishing AND Mechanical properties
    treeJournal of Electronic Packaging:;2004:;volume( 126 ):;issue: 001
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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