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contributor authorMithilesh Shah
contributor authorKaiyang Zeng
contributor authorAndrew A. O. Tay
date accessioned2017-05-09T00:12:45Z
date available2017-05-09T00:12:45Z
date copyrightMarch, 2004
date issued2004
identifier issn1528-9044
identifier otherJEPAE4-26228#87_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/129894
description abstractThe present work studies the mechanical properties of mechanically polished gold wire and wirebond using nanoindentation. Metallography of wirebond reveals undesirable coarse grain structure in HAZ due to recrystallization and grain growth. For our gold wire, the recrystallization temperature found using D.S.C. was 340.66°C and the dopants were identified using TOF-SIMS and hardness dependence on load was studied using nanoindentation. The nanoindentation of wirebond has confirmed a v-shaped hardness profile with minima at 166 μm along the HAZ. The elastic modulus varied independent of the microstructure. A yield stress profile based on empirical hardness-yield strength correlation is predicted for the wirebond.
publisherThe American Society of Mechanical Engineers (ASME)
titleMechanical Characterization of the Heat Affected Zone of Gold Wirebonds Using Nanoindentation
typeJournal Paper
journal volume126
journal issue1
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.1648062
journal fristpage87
journal lastpage93
identifier eissn1043-7398
keywordsWire
keywordsRecrystallization
keywordsHeat
keywordsSecondary ion mass spectrometry
keywordsNanoindentation
keywordsStress
keywordsTemperature
keywordsPolishing AND Mechanical properties
treeJournal of Electronic Packaging:;2004:;volume( 126 ):;issue: 001
contenttypeFulltext


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