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    Impact of Low Temperatures on Solder Joint Failures

    Source: Journal of Electronic Packaging:;2002:;volume( 124 ):;issue: 002::page 135
    Author:
    Boris Mirman
    DOI: 10.1115/1.1465431
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: An experiment with solder joints of thin plastic packages, cycled between −10° and 110°C, has demonstrated that the majority of solder joint failures occurred at the low temperatures. In this experiment, the low temperatures caused high peeling stresses in the heel area of solder joints and, as usual, relatively low plastic shear strain (as compared with these strains at high temperatures). This fact suggests that the impact of solder peeling stresses on the solder failure is noticeably higher than is anticipated by applying the commonly used failure criteria.
    keyword(s): Solders , Stress , Shear (Mechanics) , Low temperature , Failure AND Solder joints ,
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      Impact of Low Temperatures on Solder Joint Failures

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    contributor authorBoris Mirman
    date accessioned2017-05-09T00:07:12Z
    date available2017-05-09T00:07:12Z
    date copyrightJune, 2002
    date issued2002
    identifier issn1528-9044
    identifier otherJEPAE4-26203#135_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/126618
    description abstractAn experiment with solder joints of thin plastic packages, cycled between −10° and 110°C, has demonstrated that the majority of solder joint failures occurred at the low temperatures. In this experiment, the low temperatures caused high peeling stresses in the heel area of solder joints and, as usual, relatively low plastic shear strain (as compared with these strains at high temperatures). This fact suggests that the impact of solder peeling stresses on the solder failure is noticeably higher than is anticipated by applying the commonly used failure criteria.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleImpact of Low Temperatures on Solder Joint Failures
    typeJournal Paper
    journal volume124
    journal issue2
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.1465431
    journal fristpage135
    journal lastpage137
    identifier eissn1043-7398
    keywordsSolders
    keywordsStress
    keywordsShear (Mechanics)
    keywordsLow temperature
    keywordsFailure AND Solder joints
    treeJournal of Electronic Packaging:;2002:;volume( 124 ):;issue: 002
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian