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contributor authorBoris Mirman
date accessioned2017-05-09T00:07:12Z
date available2017-05-09T00:07:12Z
date copyrightJune, 2002
date issued2002
identifier issn1528-9044
identifier otherJEPAE4-26203#135_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/126618
description abstractAn experiment with solder joints of thin plastic packages, cycled between −10° and 110°C, has demonstrated that the majority of solder joint failures occurred at the low temperatures. In this experiment, the low temperatures caused high peeling stresses in the heel area of solder joints and, as usual, relatively low plastic shear strain (as compared with these strains at high temperatures). This fact suggests that the impact of solder peeling stresses on the solder failure is noticeably higher than is anticipated by applying the commonly used failure criteria.
publisherThe American Society of Mechanical Engineers (ASME)
titleImpact of Low Temperatures on Solder Joint Failures
typeJournal Paper
journal volume124
journal issue2
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.1465431
journal fristpage135
journal lastpage137
identifier eissn1043-7398
keywordsSolders
keywordsStress
keywordsShear (Mechanics)
keywordsLow temperature
keywordsFailure AND Solder joints
treeJournal of Electronic Packaging:;2002:;volume( 124 ):;issue: 002
contenttypeFulltext


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