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    Thermomechanical Fatigue Testing and Analysis of Solder Alloys

    Source: Journal of Electronic Packaging:;2000:;volume( 122 ):;issue: 001::page 48
    Author:
    M. A. Palmer
    ,
    P. E. Redmond
    ,
    R. W. Messler
    DOI: 10.1115/1.483131
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Thermomechanical fatigue (TMF) is one of the most common causes of failure in solder joints. TMF occurs due to the introduction of stresses arising from thermal expansion mismatch during thermal cycling caused by either internal heating from power dissipation, the external environment, or both. Due to its complicated nature including partial compliance of joints, evolution of microstructure, and multiple deformation mechanisms, testing a material’s resistance to TMF is not straightforward. A method developed at Rensselaer, based on an apparatus designed at North Carolina State University, allows the direct measurement of each stress-strain cycle during thermal cycling. Through further analysis, using spreadsheet macros, it is possible to consider the energy absorbed by the joint on a per cycle basis. The interpretation of such data as well as the cumulative energy absorption can provide insight into the failure process. The behavior of three alloys, eutectic Sn–Bi, Sn–Pb, and Sn–Ag, will be presented. These data will be compared with that generated by other methods. A comparison of the behavior of these alloys, as well as the apparatus design, test method, interpretation, and possible enhancements is discussed. [S1043-7398(00)01201-9]
    keyword(s): Alloys , Solders , Electrical resistance , Stress , Cycles , Failure , Solder joints , Structural frames , Temperature , Fatigue , Manufacturing AND Fatigue testing ,
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      Thermomechanical Fatigue Testing and Analysis of Solder Alloys

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    https://yetl.yabesh.ir/yetl1/handle/yetl/123576
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    contributor authorM. A. Palmer
    contributor authorP. E. Redmond
    contributor authorR. W. Messler
    date accessioned2017-05-09T00:02:13Z
    date available2017-05-09T00:02:13Z
    date copyrightMarch, 2000
    date issued2000
    identifier issn1528-9044
    identifier otherJEPAE4-26178#48_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/123576
    description abstractThermomechanical fatigue (TMF) is one of the most common causes of failure in solder joints. TMF occurs due to the introduction of stresses arising from thermal expansion mismatch during thermal cycling caused by either internal heating from power dissipation, the external environment, or both. Due to its complicated nature including partial compliance of joints, evolution of microstructure, and multiple deformation mechanisms, testing a material’s resistance to TMF is not straightforward. A method developed at Rensselaer, based on an apparatus designed at North Carolina State University, allows the direct measurement of each stress-strain cycle during thermal cycling. Through further analysis, using spreadsheet macros, it is possible to consider the energy absorbed by the joint on a per cycle basis. The interpretation of such data as well as the cumulative energy absorption can provide insight into the failure process. The behavior of three alloys, eutectic Sn–Bi, Sn–Pb, and Sn–Ag, will be presented. These data will be compared with that generated by other methods. A comparison of the behavior of these alloys, as well as the apparatus design, test method, interpretation, and possible enhancements is discussed. [S1043-7398(00)01201-9]
    publisherThe American Society of Mechanical Engineers (ASME)
    titleThermomechanical Fatigue Testing and Analysis of Solder Alloys
    typeJournal Paper
    journal volume122
    journal issue1
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.483131
    journal fristpage48
    journal lastpage54
    identifier eissn1043-7398
    keywordsAlloys
    keywordsSolders
    keywordsElectrical resistance
    keywordsStress
    keywordsCycles
    keywordsFailure
    keywordsSolder joints
    keywordsStructural frames
    keywordsTemperature
    keywordsFatigue
    keywordsManufacturing AND Fatigue testing
    treeJournal of Electronic Packaging:;2000:;volume( 122 ):;issue: 001
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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