Show simple item record

contributor authorM. A. Palmer
contributor authorP. E. Redmond
contributor authorR. W. Messler
date accessioned2017-05-09T00:02:13Z
date available2017-05-09T00:02:13Z
date copyrightMarch, 2000
date issued2000
identifier issn1528-9044
identifier otherJEPAE4-26178#48_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/123576
description abstractThermomechanical fatigue (TMF) is one of the most common causes of failure in solder joints. TMF occurs due to the introduction of stresses arising from thermal expansion mismatch during thermal cycling caused by either internal heating from power dissipation, the external environment, or both. Due to its complicated nature including partial compliance of joints, evolution of microstructure, and multiple deformation mechanisms, testing a material’s resistance to TMF is not straightforward. A method developed at Rensselaer, based on an apparatus designed at North Carolina State University, allows the direct measurement of each stress-strain cycle during thermal cycling. Through further analysis, using spreadsheet macros, it is possible to consider the energy absorbed by the joint on a per cycle basis. The interpretation of such data as well as the cumulative energy absorption can provide insight into the failure process. The behavior of three alloys, eutectic Sn–Bi, Sn–Pb, and Sn–Ag, will be presented. These data will be compared with that generated by other methods. A comparison of the behavior of these alloys, as well as the apparatus design, test method, interpretation, and possible enhancements is discussed. [S1043-7398(00)01201-9]
publisherThe American Society of Mechanical Engineers (ASME)
titleThermomechanical Fatigue Testing and Analysis of Solder Alloys
typeJournal Paper
journal volume122
journal issue1
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.483131
journal fristpage48
journal lastpage54
identifier eissn1043-7398
keywordsAlloys
keywordsSolders
keywordsElectrical resistance
keywordsStress
keywordsCycles
keywordsFailure
keywordsSolder joints
keywordsStructural frames
keywordsTemperature
keywordsFatigue
keywordsManufacturing AND Fatigue testing
treeJournal of Electronic Packaging:;2000:;volume( 122 ):;issue: 001
contenttypeFulltext


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record