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    Analysis and Modeling of Surface Waviness Inspection with Light Reflection, Part 2: Back-Lighted Grid Method

    Source: Journal of Manufacturing Science and Engineering:;1999:;volume( 121 ):;issue: 004::page 785
    Author:
    Ching-Chih Lee
    DOI: 10.1115/1.2833145
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The back-lighted grid method for inspecting a reflective surface has been studied with analytical derivations and numerical modeling. The displacement of the image of a grid point due to surface waviness was found to be proportional to the surface slope along the viewing direction at the reflecting point and the distance between the grid and the reflecting point. The 2-D and 3-D numerical modeling was verified with analytical relations, and the 3-D modeling was then tested with the reflection from a profiled SMC (sheet molding compound) panel. The effects of short-term waviness, light box inclination, viewing angle, and surface waviness orientation are investigated. The reflection image patterns for typical surface features are predicted and characterized.
    keyword(s): Inspection , Modeling , Light reflection , Computer simulation , Reflection , Sliding mode control , Particle filtering (numerical methods) , Surface mount components AND Displacement ,
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      Analysis and Modeling of Surface Waviness Inspection with Light Reflection, Part 2: Back-Lighted Grid Method

    URI
    https://yetl.yabesh.ir/yetl1/handle/yetl/122454
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    contributor authorChing-Chih Lee
    date accessioned2017-05-09T00:00:12Z
    date available2017-05-09T00:00:12Z
    date copyrightNovember, 1999
    date issued1999
    identifier issn1087-1357
    identifier otherJMSEFK-27351#785_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/122454
    description abstractThe back-lighted grid method for inspecting a reflective surface has been studied with analytical derivations and numerical modeling. The displacement of the image of a grid point due to surface waviness was found to be proportional to the surface slope along the viewing direction at the reflecting point and the distance between the grid and the reflecting point. The 2-D and 3-D numerical modeling was verified with analytical relations, and the 3-D modeling was then tested with the reflection from a profiled SMC (sheet molding compound) panel. The effects of short-term waviness, light box inclination, viewing angle, and surface waviness orientation are investigated. The reflection image patterns for typical surface features are predicted and characterized.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleAnalysis and Modeling of Surface Waviness Inspection with Light Reflection, Part 2: Back-Lighted Grid Method
    typeJournal Paper
    journal volume121
    journal issue4
    journal titleJournal of Manufacturing Science and Engineering
    identifier doi10.1115/1.2833145
    journal fristpage785
    journal lastpage792
    identifier eissn1528-8935
    keywordsInspection
    keywordsModeling
    keywordsLight reflection
    keywordsComputer simulation
    keywordsReflection
    keywordsSliding mode control
    keywordsParticle filtering (numerical methods)
    keywordsSurface mount components AND Displacement
    treeJournal of Manufacturing Science and Engineering:;1999:;volume( 121 ):;issue: 004
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian