| contributor author | Ching-Chih Lee | |
| date accessioned | 2017-05-09T00:00:12Z | |
| date available | 2017-05-09T00:00:12Z | |
| date copyright | November, 1999 | |
| date issued | 1999 | |
| identifier issn | 1087-1357 | |
| identifier other | JMSEFK-27351#785_1.pdf | |
| identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/122454 | |
| description abstract | The back-lighted grid method for inspecting a reflective surface has been studied with analytical derivations and numerical modeling. The displacement of the image of a grid point due to surface waviness was found to be proportional to the surface slope along the viewing direction at the reflecting point and the distance between the grid and the reflecting point. The 2-D and 3-D numerical modeling was verified with analytical relations, and the 3-D modeling was then tested with the reflection from a profiled SMC (sheet molding compound) panel. The effects of short-term waviness, light box inclination, viewing angle, and surface waviness orientation are investigated. The reflection image patterns for typical surface features are predicted and characterized. | |
| publisher | The American Society of Mechanical Engineers (ASME) | |
| title | Analysis and Modeling of Surface Waviness Inspection with Light Reflection, Part 2: Back-Lighted Grid Method | |
| type | Journal Paper | |
| journal volume | 121 | |
| journal issue | 4 | |
| journal title | Journal of Manufacturing Science and Engineering | |
| identifier doi | 10.1115/1.2833145 | |
| journal fristpage | 785 | |
| journal lastpage | 792 | |
| identifier eissn | 1528-8935 | |
| keywords | Inspection | |
| keywords | Modeling | |
| keywords | Light reflection | |
| keywords | Computer simulation | |
| keywords | Reflection | |
| keywords | Sliding mode control | |
| keywords | Particle filtering (numerical methods) | |
| keywords | Surface mount components AND Displacement | |
| tree | Journal of Manufacturing Science and Engineering:;1999:;volume( 121 ):;issue: 004 | |
| contenttype | Fulltext | |