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contributor authorChing-Chih Lee
date accessioned2017-05-09T00:00:12Z
date available2017-05-09T00:00:12Z
date copyrightNovember, 1999
date issued1999
identifier issn1087-1357
identifier otherJMSEFK-27351#785_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/122454
description abstractThe back-lighted grid method for inspecting a reflective surface has been studied with analytical derivations and numerical modeling. The displacement of the image of a grid point due to surface waviness was found to be proportional to the surface slope along the viewing direction at the reflecting point and the distance between the grid and the reflecting point. The 2-D and 3-D numerical modeling was verified with analytical relations, and the 3-D modeling was then tested with the reflection from a profiled SMC (sheet molding compound) panel. The effects of short-term waviness, light box inclination, viewing angle, and surface waviness orientation are investigated. The reflection image patterns for typical surface features are predicted and characterized.
publisherThe American Society of Mechanical Engineers (ASME)
titleAnalysis and Modeling of Surface Waviness Inspection with Light Reflection, Part 2: Back-Lighted Grid Method
typeJournal Paper
journal volume121
journal issue4
journal titleJournal of Manufacturing Science and Engineering
identifier doi10.1115/1.2833145
journal fristpage785
journal lastpage792
identifier eissn1528-8935
keywordsInspection
keywordsModeling
keywordsLight reflection
keywordsComputer simulation
keywordsReflection
keywordsSliding mode control
keywordsParticle filtering (numerical methods)
keywordsSurface mount components AND Displacement
treeJournal of Manufacturing Science and Engineering:;1999:;volume( 121 ):;issue: 004
contenttypeFulltext


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