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    Precision Grinding of Ultra-Thin Quartz Wafers

    Source: Journal of Manufacturing Science and Engineering:;1993:;volume( 115 ):;issue: 003::page 258
    Author:
    T. G. Bifano
    ,
    J. B. Hosler
    DOI: 10.1115/1.2901658
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: For bulk acoustic wave quartz resonators, the central resonant frequency is inversely proportional to the wafer thickness. The tolerance of the resonant frequency is directly proportional to the total thickness variation of the quartz wafer. To increase the operating frequency while preserving a high tolerance on frequency, thinner quartz wafers with better thickness tolerances are needed. This paper describes the design and implementation of a precision grinding apparatus capable of producing ultra-thin quartz wafers to better thickness tolerances than previously achieved. A distributed-stress fixturing method that permits machining of ultra-thin, brittle substrates is described. The machine’s precision has been achieved through a high stiffness structural loop and real-time position feedback control. Optical interferometry is used in a new technique to measure thickness variation over the entire wafer. This research will enable production of quartz crystal oscillators with higher frequencies and better quality for the resonator industry.
    keyword(s): Semiconductor wafers , Grinding , Accuracy , Quartz , Thickness , Stiffness , Feedback , Frequency , Stress , Quartz crystals , Waves , Design , Fixturing , Machining , Interferometry , Acoustics AND Brittleness ,
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      Precision Grinding of Ultra-Thin Quartz Wafers

    URI
    https://yetl.yabesh.ir/yetl1/handle/yetl/112226
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    • Journal of Manufacturing Science and Engineering

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    contributor authorT. G. Bifano
    contributor authorJ. B. Hosler
    date accessioned2017-05-08T23:41:50Z
    date available2017-05-08T23:41:50Z
    date copyrightAugust, 1993
    date issued1993
    identifier issn1087-1357
    identifier otherJMSEFK-27765#258_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/112226
    description abstractFor bulk acoustic wave quartz resonators, the central resonant frequency is inversely proportional to the wafer thickness. The tolerance of the resonant frequency is directly proportional to the total thickness variation of the quartz wafer. To increase the operating frequency while preserving a high tolerance on frequency, thinner quartz wafers with better thickness tolerances are needed. This paper describes the design and implementation of a precision grinding apparatus capable of producing ultra-thin quartz wafers to better thickness tolerances than previously achieved. A distributed-stress fixturing method that permits machining of ultra-thin, brittle substrates is described. The machine’s precision has been achieved through a high stiffness structural loop and real-time position feedback control. Optical interferometry is used in a new technique to measure thickness variation over the entire wafer. This research will enable production of quartz crystal oscillators with higher frequencies and better quality for the resonator industry.
    publisherThe American Society of Mechanical Engineers (ASME)
    titlePrecision Grinding of Ultra-Thin Quartz Wafers
    typeJournal Paper
    journal volume115
    journal issue3
    journal titleJournal of Manufacturing Science and Engineering
    identifier doi10.1115/1.2901658
    journal fristpage258
    journal lastpage262
    identifier eissn1528-8935
    keywordsSemiconductor wafers
    keywordsGrinding
    keywordsAccuracy
    keywordsQuartz
    keywordsThickness
    keywordsStiffness
    keywordsFeedback
    keywordsFrequency
    keywordsStress
    keywordsQuartz crystals
    keywordsWaves
    keywordsDesign
    keywordsFixturing
    keywordsMachining
    keywordsInterferometry
    keywordsAcoustics AND Brittleness
    treeJournal of Manufacturing Science and Engineering:;1993:;volume( 115 ):;issue: 003
    contenttypeFulltext
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