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contributor authorT. G. Bifano
contributor authorJ. B. Hosler
date accessioned2017-05-08T23:41:50Z
date available2017-05-08T23:41:50Z
date copyrightAugust, 1993
date issued1993
identifier issn1087-1357
identifier otherJMSEFK-27765#258_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/112226
description abstractFor bulk acoustic wave quartz resonators, the central resonant frequency is inversely proportional to the wafer thickness. The tolerance of the resonant frequency is directly proportional to the total thickness variation of the quartz wafer. To increase the operating frequency while preserving a high tolerance on frequency, thinner quartz wafers with better thickness tolerances are needed. This paper describes the design and implementation of a precision grinding apparatus capable of producing ultra-thin quartz wafers to better thickness tolerances than previously achieved. A distributed-stress fixturing method that permits machining of ultra-thin, brittle substrates is described. The machine’s precision has been achieved through a high stiffness structural loop and real-time position feedback control. Optical interferometry is used in a new technique to measure thickness variation over the entire wafer. This research will enable production of quartz crystal oscillators with higher frequencies and better quality for the resonator industry.
publisherThe American Society of Mechanical Engineers (ASME)
titlePrecision Grinding of Ultra-Thin Quartz Wafers
typeJournal Paper
journal volume115
journal issue3
journal titleJournal of Manufacturing Science and Engineering
identifier doi10.1115/1.2901658
journal fristpage258
journal lastpage262
identifier eissn1528-8935
keywordsSemiconductor wafers
keywordsGrinding
keywordsAccuracy
keywordsQuartz
keywordsThickness
keywordsStiffness
keywordsFeedback
keywordsFrequency
keywordsStress
keywordsQuartz crystals
keywordsWaves
keywordsDesign
keywordsFixturing
keywordsMachining
keywordsInterferometry
keywordsAcoustics AND Brittleness
treeJournal of Manufacturing Science and Engineering:;1993:;volume( 115 ):;issue: 003
contenttypeFulltext


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