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    Mechanical Modeling of Multilayered Films on an Elastic Substrate—Part I: Analysis

    Source: Journal of Electronic Packaging:;1990:;volume( 112 ):;issue: 004::page 309
    Author:
    F. Erdogan
    ,
    P. F. Joseph
    DOI: 10.1115/1.2904383
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: In this paper the basic residual stress problem for multilayered or multiple films on an elastic substrate is considered. The stresses may be caused by a homogeneous temperature variation or slow thermal cycling and by far field mechanical loading. The films are approximated by orthotropic membranes and the substrate is assumed to be an elastic continuum. The interfacial zone is modeled by either an ideal interface or a homogeneous shear layer. The primary interest in the paper is in examining stress concentrations or singularities near the film ends. For the two interface conditions considered, this is done by varying the film/substrate contact angle. Also studied are strain energy release rate for the propagation of an interfacial crack and the direction and the magnitude of the maximum cleavage stress for a possible crack initiation in the substrate. The basic modeling and analysis are considered in Part I. Part II of the paper is devoted to the presentation and discussion of the results.
    keyword(s): Modeling ,
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      Mechanical Modeling of Multilayered Films on an Elastic Substrate—Part I: Analysis

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    https://yetl.yabesh.ir/yetl1/handle/yetl/106743
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    contributor authorF. Erdogan
    contributor authorP. F. Joseph
    date accessioned2017-05-08T23:32:20Z
    date available2017-05-08T23:32:20Z
    date copyrightDecember, 1990
    date issued1990
    identifier issn1528-9044
    identifier otherJEPAE4-26119#309_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/106743
    description abstractIn this paper the basic residual stress problem for multilayered or multiple films on an elastic substrate is considered. The stresses may be caused by a homogeneous temperature variation or slow thermal cycling and by far field mechanical loading. The films are approximated by orthotropic membranes and the substrate is assumed to be an elastic continuum. The interfacial zone is modeled by either an ideal interface or a homogeneous shear layer. The primary interest in the paper is in examining stress concentrations or singularities near the film ends. For the two interface conditions considered, this is done by varying the film/substrate contact angle. Also studied are strain energy release rate for the propagation of an interfacial crack and the direction and the magnitude of the maximum cleavage stress for a possible crack initiation in the substrate. The basic modeling and analysis are considered in Part I. Part II of the paper is devoted to the presentation and discussion of the results.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleMechanical Modeling of Multilayered Films on an Elastic Substrate—Part I: Analysis
    typeJournal Paper
    journal volume112
    journal issue4
    journal titleJournal of Electronic Packaging
    identifier doi10.1115/1.2904383
    journal fristpage309
    journal lastpage316
    identifier eissn1043-7398
    keywordsModeling
    treeJournal of Electronic Packaging:;1990:;volume( 112 ):;issue: 004
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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