Show simple item record

contributor authorF. Erdogan
contributor authorP. F. Joseph
date accessioned2017-05-08T23:32:20Z
date available2017-05-08T23:32:20Z
date copyrightDecember, 1990
date issued1990
identifier issn1528-9044
identifier otherJEPAE4-26119#309_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/106743
description abstractIn this paper the basic residual stress problem for multilayered or multiple films on an elastic substrate is considered. The stresses may be caused by a homogeneous temperature variation or slow thermal cycling and by far field mechanical loading. The films are approximated by orthotropic membranes and the substrate is assumed to be an elastic continuum. The interfacial zone is modeled by either an ideal interface or a homogeneous shear layer. The primary interest in the paper is in examining stress concentrations or singularities near the film ends. For the two interface conditions considered, this is done by varying the film/substrate contact angle. Also studied are strain energy release rate for the propagation of an interfacial crack and the direction and the magnitude of the maximum cleavage stress for a possible crack initiation in the substrate. The basic modeling and analysis are considered in Part I. Part II of the paper is devoted to the presentation and discussion of the results.
publisherThe American Society of Mechanical Engineers (ASME)
titleMechanical Modeling of Multilayered Films on an Elastic Substrate—Part I: Analysis
typeJournal Paper
journal volume112
journal issue4
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.2904383
journal fristpage309
journal lastpage316
identifier eissn1043-7398
keywordsModeling
treeJournal of Electronic Packaging:;1990:;volume( 112 ):;issue: 004
contenttypeFulltext


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record