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    Measuring Tool-Chip Interface Temperatures

    Source: Journal of Manufacturing Science and Engineering:;1986:;volume( 108 ):;issue: 002::page 101
    Author:
    J. P. Kottenstette
    DOI: 10.1115/1.3187043
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: A two-color pyrometer was developed for monitoring the surface temperature of metal chips formed during high-speed machining processes. Optical access to the tool-chip interface was obtained by cementing a plastic light pipe into a 1/16-in. (1.6-mm) hole milled through the carbide tool insert. The light pipe serves to transmit radiation falling on the rake face of the insert to radiation detectors located elsewhere. Radiation captured by the light pipe is passed through a lens-beam splitter combination and imaged on two identical photodiode detectors. The diodes have integral operational amplifiers to achieve high detectivity and low-noise operation. Each photodiode is masked by an interference type narrow-band filter having spectral bandpass frequencies chosen to match the point where the emittance of several metals is constant for all temperatures. Thus, the temperature of the chip stream monitored by the diodes is a function of the intensity measured for each spectral band at the same instant in time. The functional relationship between true temperature and the ratio of signal amplitudes (the calibration curve) was established for pyrometer over the interval 1000–1750 K using standard laboratory methods.
    keyword(s): Temperature , Pipes , Metals , Radiation (Physics) , Photodiodes , Pyrometers , Signals , Noise (Sound) , Machining , Sensors , Lenses (Optics) , Radiation detectors , Calibration , Filters AND Frequency ,
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      Measuring Tool-Chip Interface Temperatures

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    https://yetl.yabesh.ir/yetl1/handle/yetl/101393
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    contributor authorJ. P. Kottenstette
    date accessioned2017-05-08T23:22:57Z
    date available2017-05-08T23:22:57Z
    date copyrightMay, 1986
    date issued1986
    identifier issn1087-1357
    identifier otherJMSEFK-27718#101_1.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/101393
    description abstractA two-color pyrometer was developed for monitoring the surface temperature of metal chips formed during high-speed machining processes. Optical access to the tool-chip interface was obtained by cementing a plastic light pipe into a 1/16-in. (1.6-mm) hole milled through the carbide tool insert. The light pipe serves to transmit radiation falling on the rake face of the insert to radiation detectors located elsewhere. Radiation captured by the light pipe is passed through a lens-beam splitter combination and imaged on two identical photodiode detectors. The diodes have integral operational amplifiers to achieve high detectivity and low-noise operation. Each photodiode is masked by an interference type narrow-band filter having spectral bandpass frequencies chosen to match the point where the emittance of several metals is constant for all temperatures. Thus, the temperature of the chip stream monitored by the diodes is a function of the intensity measured for each spectral band at the same instant in time. The functional relationship between true temperature and the ratio of signal amplitudes (the calibration curve) was established for pyrometer over the interval 1000–1750 K using standard laboratory methods.
    publisherThe American Society of Mechanical Engineers (ASME)
    titleMeasuring Tool-Chip Interface Temperatures
    typeJournal Paper
    journal volume108
    journal issue2
    journal titleJournal of Manufacturing Science and Engineering
    identifier doi10.1115/1.3187043
    journal fristpage101
    journal lastpage104
    identifier eissn1528-8935
    keywordsTemperature
    keywordsPipes
    keywordsMetals
    keywordsRadiation (Physics)
    keywordsPhotodiodes
    keywordsPyrometers
    keywordsSignals
    keywordsNoise (Sound)
    keywordsMachining
    keywordsSensors
    keywordsLenses (Optics)
    keywordsRadiation detectors
    keywordsCalibration
    keywordsFilters AND Frequency
    treeJournal of Manufacturing Science and Engineering:;1986:;volume( 108 ):;issue: 002
    contenttypeFulltext
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