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contributor authorJ. P. Kottenstette
date accessioned2017-05-08T23:22:57Z
date available2017-05-08T23:22:57Z
date copyrightMay, 1986
date issued1986
identifier issn1087-1357
identifier otherJMSEFK-27718#101_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/101393
description abstractA two-color pyrometer was developed for monitoring the surface temperature of metal chips formed during high-speed machining processes. Optical access to the tool-chip interface was obtained by cementing a plastic light pipe into a 1/16-in. (1.6-mm) hole milled through the carbide tool insert. The light pipe serves to transmit radiation falling on the rake face of the insert to radiation detectors located elsewhere. Radiation captured by the light pipe is passed through a lens-beam splitter combination and imaged on two identical photodiode detectors. The diodes have integral operational amplifiers to achieve high detectivity and low-noise operation. Each photodiode is masked by an interference type narrow-band filter having spectral bandpass frequencies chosen to match the point where the emittance of several metals is constant for all temperatures. Thus, the temperature of the chip stream monitored by the diodes is a function of the intensity measured for each spectral band at the same instant in time. The functional relationship between true temperature and the ratio of signal amplitudes (the calibration curve) was established for pyrometer over the interval 1000–1750 K using standard laboratory methods.
publisherThe American Society of Mechanical Engineers (ASME)
titleMeasuring Tool-Chip Interface Temperatures
typeJournal Paper
journal volume108
journal issue2
journal titleJournal of Manufacturing Science and Engineering
identifier doi10.1115/1.3187043
journal fristpage101
journal lastpage104
identifier eissn1528-8935
keywordsTemperature
keywordsPipes
keywordsMetals
keywordsRadiation (Physics)
keywordsPhotodiodes
keywordsPyrometers
keywordsSignals
keywordsNoise (Sound)
keywordsMachining
keywordsSensors
keywordsLenses (Optics)
keywordsRadiation detectors
keywordsCalibration
keywordsFilters AND Frequency
treeJournal of Manufacturing Science and Engineering:;1986:;volume( 108 ):;issue: 002
contenttypeFulltext


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