Statistics
Total Visits
| Views | |
|---|---|
| Classification of Chip-Level Defect Types in Wafer Bin Maps Using Only Wafer-Level Labels | 38 |
Total Visits Per Month
| May 2026 | June 2026 | July 2026 | August 2026 | September 2026 | October 2026 | November 2026 | |
|---|---|---|---|---|---|---|---|
| Classification of Chip-Level Defect Types in Wafer Bin Maps Using Only Wafer-Level Labels | 0 | 0 | 0 | 0 | 2 | 3 | 2 |
File Visits
| Views |
|---|
Top country views
| Views | |
|---|---|
| China | 21 |
| United States | 5 |
| Finland | 2 |
| Argentina | 1 |
| Algeria | 1 |
| Spain | 1 |
| France | 1 |
| India | 1 |
| Moldova | 1 |
| Ukraine | 1 |
Top cities views
| Views | |
|---|---|
| Tianjin | 10 |
| Nanjing | 3 |
| San Mateo | 3 |
| Hangzhou | 2 |
| Algiers | 1 |
| Andover | 1 |
| Blue Bell | 1 |
| El Puerto De Santa María | 1 |
| Espoo | 1 |
| Federal | 1 |