| dc.contributor.author | Hrdy, Mark | |
| dc.contributor.author | Mallavarapu, Akhila | |
| dc.contributor.author | Castañeda, Mariana | |
| dc.contributor.author | Ajay, Paras | |
| dc.contributor.author | Sreenivasan, S. V. | |
| dc.date.accessioned | 2024-12-24T19:08:03Z | |
| dc.date.available | 2024-12-24T19:08:03Z | |
| dc.date.copyright | 2/15/2024 12:00:00 AM | |
| dc.date.issued | 2024 | |
| dc.identifier.issn | 2166-0468 | |
| dc.identifier.other | jmnm_011_01_011005.pdf | |
| dc.identifier.uri | http://yetl.yabesh.ir/yetl1/handle/yetl/4303345 | |
| dc.description.abstract | This paper presents catalyst patterning techniques for promoting wafer-scale uniformity while producing taper-free high aspect ratio Si nanostructures using gold (Au) metal-assisted chemical etch (MacEtch). Typical Au nanopatterning involves the use of liftoff processes which have poor yield in manufacturing settings. We report a technique that takes advantage of adhesive forces during MacEtch to mechanically break the metal catalyst over a patterned resist. Three methods for generating increased uniformity are demonstrated—(i), (ii), (iii). Using these methods, taper-free 100 nm nanopillars are presented with wafer-scale uniformity using techniques that can be readily implemented for scalable nanomanufacturing. | |
| dc.publisher | The American Society of Mechanical Engineers (ASME) | |
| dc.title | Scalable Au Metal-Assisted Chemical Etch Nanopatterning Using Enhanced Metal Break Techniques | |
| dc.type | Journal Paper | |
| dc.journal.volume | 11 | |
| dc.journal.issue | 1 | |
| dc.journal.title | Journal of Micro and Nano-Manufacturing | |
| dc.identifier.doi | 10.1115/1.4064611 | |
| dc.journal.fristpage | 11005-1 | |
| dc.journal.lastpage | 11005-7 | |
| dc.page | 7 | |
| dc.tree | Journal of Micro and Nano-Manufacturing:;2024:;volume( 011 ):;issue: 001 | |
| dc.contenttype | Fulltext | |