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dc.contributor.authorHrdy, Mark
dc.contributor.authorMallavarapu, Akhila
dc.contributor.authorCastañeda, Mariana
dc.contributor.authorAjay, Paras
dc.contributor.authorSreenivasan, S. V.
dc.date.accessioned2024-12-24T19:08:03Z
dc.date.available2024-12-24T19:08:03Z
dc.date.copyright2/15/2024 12:00:00 AM
dc.date.issued2024
dc.identifier.issn2166-0468
dc.identifier.otherjmnm_011_01_011005.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4303345
dc.description.abstractThis paper presents catalyst patterning techniques for promoting wafer-scale uniformity while producing taper-free high aspect ratio Si nanostructures using gold (Au) metal-assisted chemical etch (MacEtch). Typical Au nanopatterning involves the use of liftoff processes which have poor yield in manufacturing settings. We report a technique that takes advantage of adhesive forces during MacEtch to mechanically break the metal catalyst over a patterned resist. Three methods for generating increased uniformity are demonstrated—(i), (ii), (iii). Using these methods, taper-free 100 nm nanopillars are presented with wafer-scale uniformity using techniques that can be readily implemented for scalable nanomanufacturing.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleScalable Au Metal-Assisted Chemical Etch Nanopatterning Using Enhanced Metal Break Techniques
dc.typeJournal Paper
dc.journal.volume11
dc.journal.issue1
dc.journal.titleJournal of Micro and Nano-Manufacturing
dc.identifier.doi10.1115/1.4064611
dc.journal.fristpage11005-1
dc.journal.lastpage11005-7
dc.page7
dc.treeJournal of Micro and Nano-Manufacturing:;2024:;volume( 011 ):;issue: 001
dc.contenttypeFulltext


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