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dc.contributor.authorLi, Yiming
dc.contributor.authorSong, Chengli
dc.contributor.authorSun, Kun
dc.date.accessioned2022-05-08T08:29:08Z
dc.date.available2022-05-08T08:29:08Z
dc.date.copyright3/31/2022 12:00:00 AM
dc.date.issued2022
dc.identifier.issn1932-6181
dc.identifier.othermed_016_03_031002.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4283982
dc.description.abstractThe mechanical behavior of the ventricular septal defect (VSD) occluder is strongly linked to complications following transcatheter closure of the VSD. Methods: A mechanical model of the VSD occluder was constructed by theoretical modeling of the braiding structure. The mechanical properties of the VSD occluders with different braiding angles (30 deg, 45 deg, 60 deg), materials (nitinol (NiTi), polydioxanone (PDO)), and waist-heights (3 mm, 4 mm) were studied by finite element analysis and validated by bench tests. Under 1 mm radial shrinkage, the bending angles at the waist of the 30 deg NiTi, 45 deg NiTi, 60 deg NiTi and 45 deg PDO occluders were 112 deg, 121 deg, 155 deg and 155 deg, respectively. The maximum principal strains at the waist were 16.62%, 8.19%, 1.20%, and 0.66%, respectively. With 0.5 rad axial bending, the maximum radial deformations at the waist were 1.73, 1.44, 0.41 and 1.68 mm, respectively. When the occluders were implanted into VSD with the mean thickness of 3.5 mm, considerable stress developed at the hole's margin and the contact area. The area with the 3 mm occluder was much bigger than that with the 4 mm occluder. Conclusions: the 60 deg NiTi occluder showed better ability to fit the deformation of the defect than the other NiTi occluders, and the 45 deg PDO occluder performed better under compression conditions but poorly under bending conditions than the 45 deg NiTi occluder. The choice of the appropriate waist-height is beneficial to eliminate associative complication by reducing the contact stress.
dc.publisherThe American Society of Mechanical Engineers (ASME)
dc.titleFinite Element Analysis and Bench Testing of Ventricular Septal Defect Occluder
dc.typeJournal Paper
dc.journal.volume16
dc.journal.issue3
dc.journal.titleJournal of Medical Devices
dc.identifier.doi10.1115/1.4054082
dc.journal.fristpage31002-1
dc.journal.lastpage31002-8
dc.page8
dc.treeJournal of Medical Devices:;2022:;volume( 016 ):;issue: 003
dc.contenttypeFulltext


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