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Modular, Flexible, Low-Cost Microstructure Measurements: The Epsilometer

dc.contributor.authorLe Boyer, Arnaud;Alford, Matthew H.;Couto, Nicole;Goldin, Michael;Lastuka, Sean;Goheen, Sara;Nguyen, San;Lucas, Andrew J.;Hennon, Tyler D.
dc.date.accessioned2022-03-26T19:31:28Z
dc.date.available2022-03-26T19:31:28Z
dc.date.copyright01 Mar. 2021
dc.date.issued2021
dc.identifier.otherJTECH-D-20-0116.1.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4280198
dc.publisherAmerican Meteorological Society
dc.titleModular, Flexible, Low-Cost Microstructure Measurements: The Epsilometer
dc.typeJournal Paper
dc.journal.volume38
dc.journal.issue3
dc.journal.titleJournal of Atmospheric and Oceanic Technology
dc.identifier.doi10.1175/JTECH-D-20-0116.1
dc.journal.fristpage657
dc.journal.lastpage668
dc.treeJournal of Atmospheric and Oceanic Technology:;2021:;volume( 038 ):;issue: 003
dc.contenttypeFulltext


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