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    Modular, Flexible, Low-Cost Microstructure Measurements: The Epsilometer

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    JTECH-D-20-0116.1.pdf (2.766Mb)
    Date
    2021
    Author
    Le Boyer, Arnaud;Alford, Matthew H.;Couto, Nicole;Goldin, Michael;Lastuka, Sean;Goheen, Sara;Nguyen, San;Lucas, Andrew J.;Hennon, Tyler D.
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    URI
    http://yetl.yabesh.ir/yetl1/handle/yetl/4280198
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