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dc.contributor.authorUppal, Aastha
dc.contributor.authorPeterson, Jerrod
dc.contributor.authorChang, Je-Young
dc.contributor.authorGuo, Xi
dc.contributor.authorLiang, Frank
dc.contributor.authorTang, Weihua
dc.date.accessioned2019-09-18T09:04:01Z
dc.date.available2019-09-18T09:04:01Z
dc.date.copyright3/4/2019 12:00:00 AM
dc.date.issued2019
dc.identifier.issn1043-7398
dc.identifier.otherep_141_01_010803.pdf
dc.identifier.urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4258459
dc.description.abstractThe demands for both thinner bare-die ball grid array (BGA) packages and thinner thermal solutions have added complexity for the thermal enabling design and material options associated with system on chip packages in mobile personal computer (PC) platforms. The thermomechanical interactions between the bare-die package and the thermal solution are very critical, creating the needs for: (1) an in-depth thermomechanical characterization to understand their impacts on product quality and performance and (2) a simple and yet robust modeling methodology to analyze design parameters using a commercially available software. In this paper, experimental metrologies and modeling methodology are developed with the details of contents documented. Validation of the newly developed tools and recommendation/guidance are also discussed for detailed assessments of thermomechanical tradeoffs for optimal design spaces for next-generation mobile platforms.
dc.publisherAmerican Society of Mechanical Engineers (ASME)
dc.titleThermomechanical Interaction Between Thin Bare-Die Package and Thermal Solution in Next-Generation Mobile Computing Platforms
dc.typeJournal Paper
dc.journal.volume141
dc.journal.issue1
dc.journal.titleJournal of Electronic Packaging
dc.identifier.doi10.1115/1.4042801
dc.journal.fristpage10803
dc.journal.lastpage010803-8
dc.treeJournal of Electronic Packaging:;2019:;volume( 141 ):;issue: 001
dc.contenttypeFulltext


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