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    Diagonal Mode van der Pauw Stress Sensors: Proof of Diagonal-Mode Conjecture

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    ep_140_04_044501.pdf (238.1Kb)
    Date
    2018
    Author
    Jaeger, Richard C.
    Suhling, Jeffrey C.
    Chen, Jun
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    Abstract
    The conjecture discussed in our previous paper [Jaeger, R. C., Motalab, M., Hussain, S., and Suhling, J. C., 2014, “Four-Wire Bridge Measurements of Silicon van der Pauw Stress Sensors,” ASME J. Electron. Packag., 136(4), p. 041014; Jaeger, R. C., Motalab, M., Hussain, S., and Suhling, J. C., 2018, Erratum: “Four-Wire Bridge Measurements of Silicon van der Pauw Stress Sensors,” ASME J. Electron. Packag., 140(1), p. 017001] was backed up by measurements and simulation results, but not mathematically proven. A proof based upon two-port impedance parameter reciprocity is presented with additional experimental confirmation.
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    http://yetl.yabesh.ir/yetl1/handle/yetl/4254157
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