| dc.contributor.author | M. Dube | |
| dc.contributor.author | T. Kundu | |
| dc.date.accessioned | 2017-05-09T00:43:05Z | |
| dc.date.available | 2017-05-09T00:43:05Z | |
| dc.date.copyright | December, 2011 | |
| dc.date.issued | 2011 | |
| dc.identifier.issn | 1528-9044 | |
| dc.identifier.other | JEPAE4-26319#045502_1.pdf | |
| dc.identifier.uri | http://yetl.yabesh.ir/yetl/handle/yetl/145761 | |
| dc.description.abstract | We respond to the technical content of the discussion as follows: | |
| dc.publisher | The American Society of Mechanical Engineers (ASME) | |
| dc.title | Closure to “Discussion of ‘Yield Function for Solder Elastoviscoplastic Modeling’” (2005, ASME J. Electron. Packag., 127, pp. 147–156) | |
| dc.type | Journal Paper | |
| dc.journal.volume | 133 | |
| dc.journal.issue | 4 | |
| dc.journal.title | Journal of Electronic Packaging | |
| dc.identifier.doi | 10.1115/1.4000902 | |
| dc.journal.fristpage | 45502 | |
| dc.identifier.eissn | 1043-7398 | |
| dc.keywords | Electrons AND Solders | |
| dc.tree | Journal of Electronic Packaging:;2011:;volume( 133 ):;issue: 004 | |
| dc.contenttype | Fulltext | |