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    Piezoelectric Effect on the Buckling of Piezoelectric Thin Film with Viscoelastic Substrate

    Source: Journal of Nanomechanics and Micromechanics:;2014:;Volume ( 004 ):;issue: 001
    Author:
    Zhidong Zhou
    ,
    Dongdong Wang
    ,
    Quan Jiang
    DOI: 10.1061/(ASCE)NM.2153-5477.0000081
    Publisher: American Society of Civil Engineers
    Abstract: This work aims to study the buckling kinetic process of a piezoelectric thin film (nanoribbon) bonded to a viscoelastic compliant layer with rigid support. The piezoelectric thin film is assumed to be poled in the thickness direction and is governed by the nonlinear coupled electromechanical equations. Subsequently, on the basis of the classical elastic-viscoelastic correspondence principle, the kinetic process of the thin film buckling under the intermediate stress state is analyzed in a systematic manner. In particular the piezoelectric effect is examined with respect to the critical wavelength, the wavelength of the fastest growing mode, the critical stress, and the fastest growth rate in detail. The results evince that the piezoelectricity has an evident stiffening effect on the kinetic buckling process of the thin film with viscoelastic substrate.
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      Piezoelectric Effect on the Buckling of Piezoelectric Thin Film with Viscoelastic Substrate

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    http://yetl.yabesh.ir/yetl1/handle/yetl/67584
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    contributor authorZhidong Zhou
    contributor authorDongdong Wang
    contributor authorQuan Jiang
    date accessioned2017-05-08T21:57:56Z
    date available2017-05-08T21:57:56Z
    date copyrightMarch 2014
    date issued2014
    identifier other%28asce%29ps%2E1949-1204%2E0000076.pdf
    identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/67584
    description abstractThis work aims to study the buckling kinetic process of a piezoelectric thin film (nanoribbon) bonded to a viscoelastic compliant layer with rigid support. The piezoelectric thin film is assumed to be poled in the thickness direction and is governed by the nonlinear coupled electromechanical equations. Subsequently, on the basis of the classical elastic-viscoelastic correspondence principle, the kinetic process of the thin film buckling under the intermediate stress state is analyzed in a systematic manner. In particular the piezoelectric effect is examined with respect to the critical wavelength, the wavelength of the fastest growing mode, the critical stress, and the fastest growth rate in detail. The results evince that the piezoelectricity has an evident stiffening effect on the kinetic buckling process of the thin film with viscoelastic substrate.
    publisherAmerican Society of Civil Engineers
    titlePiezoelectric Effect on the Buckling of Piezoelectric Thin Film with Viscoelastic Substrate
    typeJournal Paper
    journal volume4
    journal issue1
    journal titleJournal of Nanomechanics and Micromechanics
    identifier doi10.1061/(ASCE)NM.2153-5477.0000081
    treeJournal of Nanomechanics and Micromechanics:;2014:;Volume ( 004 ):;issue: 001
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
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