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contributor authorSuresh Bhalla
contributor authorPraveen Kumar
contributor authorAshok Gupta
contributor authorTushar K. Datta
date accessioned2017-05-08T21:16:29Z
date available2017-05-08T21:16:29Z
date copyrightOctober 2009
date issued2009
identifier other%28asce%290893-1321%282009%2922%3A4%28373%29.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/45182
description abstractThe electromechanical impedance technique employs surface-bonded lead zirconate titanate piezoelectric ceramic patches as impedance transducers for structural health monitoring and nondestructive evaluation. The patches are bonded to the monitored structures using finitely thick adhesive bond layer, which introduces shear lag effect, thus invariably influencing the electromechanical admittance signatures. This paper presents a new simplified impedance model to incorporate shear lag effect into electromechanical admittance formulations, both one-dimensional and two-dimensional. This provides a closed-form analytical solution of the inverse problem, i.e. to derive the true structural impedance from the measured conductance and susceptance signatures, thus an improvement over the existing models. The influence of various parameters (associated with the bond layer) on admittance signatures is investigated using the proposed model and the results compared with existing models. The results show that the new model, which is far simpler than the existing models, models the shear lag phenomenon reasonably well besides providing direct solution of a complex inverse problem.
publisherAmerican Society of Civil Engineers
titleSimplified Impedance Model for Adhesively Bonded Piezo-Impedance Transducers
typeJournal Paper
journal volume22
journal issue4
journal titleJournal of Aerospace Engineering
identifier doi10.1061/(ASCE)0893-1321(2009)22:4(373)
treeJournal of Aerospace Engineering:;2009:;Volume ( 022 ):;issue: 004
contenttypeFulltext


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