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contributor authorVan Bossuyt, Douglas L.
contributor authorAllaire, Douglas
contributor authorBickford, Jason F.
contributor authorBozada, Thomas A.
contributor authorChen, Wei (Wayne)
contributor authorCutitta, Roger P.
contributor authorCuzner, Robert
contributor authorFletcher, Kristen
contributor authorGiachetti, Ronald
contributor authorHale, Britta
contributor authorHuang, H. Howie
contributor authorKeidar, Michael
contributor authorLayton, Astrid
contributor authorLedford, Allison|
date accessioned2025-08-20T09:41:02Z
date available2025-08-20T09:41:02Z
date copyright4/16/2025 12:00:00 AM
date issued2025
identifier issn1530-9827
identifier otherjcise-24-1514.pdf
identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4308678
description abstractWhile digital twin (DT) has made significant strides in recent years, much work remains to be done in the research community and in the industry to fully realize the benefits of DT. A group of 25 industry professionals, US federal government researchers, and academics came together from 11 different institutions and organizations to identify 14 key thrusts and 3 cross-cutting areas for further DT research and development (R&D). This article presents our vision for the future of DT R&D, provides historical context for DT’s birth and growth as a field, provides examples of DTs in use in industry and the lab, and discusses the current state of DT research. We hope that this article serves as a nucleation point for future R&D efforts and provides the community with shared vision and trajectory to collectively advance DT so that society can more rapidly see the benefits of DT.
publisherThe American Society of Mechanical Engineers (ASME)
titleThe Future of Digital Twin Research and Development
typeJournal Paper
journal volume25
journal issue8
journal titleJournal of Computing and Information Science in Engineering
identifier doi10.1115/1.4068082
journal fristpage80801-1
journal lastpage80801-34
page34
treeJournal of Computing and Information Science in Engineering:;2025:;volume( 025 ):;issue: 008
contenttypeFulltext


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