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contributor authorPan, Bo
contributor authorKang, Renke
contributor authorZhu, Xu
contributor authorYang, Zhe
contributor authorZhang, Juntao
contributor authorGuo, Jiang
date accessioned2023-08-16T18:40:23Z
date available2023-08-16T18:40:23Z
date copyright3/29/2023 12:00:00 AM
date issued2023
identifier issn1087-1357
identifier othermanu_145_7_074501.pdf
identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4292301
description abstractDouble-sided lapping (DSL) is always employed as a precision process for machining flat workpieces, such as optical windows, wafers, and brake pads taking advantage of its high efficiency and parallelism. However, the mechanism of parallelism error reduced by the DSL process was rarely investigated. Furthermore, the relationship between parallelism and flatness was not clearly illustrated. To explain why the parallelism of workpieces becomes convergent by the DSL, a theoretical model has been developed in this paper by calculating the parallelism evolution with the consideration of various contact situations between workpieces and lapping plates for the first time. Moreover, five workpieces, including a slanted and four parallel ones, are applied to develop the parallelism evolution guaranteeing the model close to the actual process, and the mechanism of the parallelism error reduced by the DSL process is elucidated. The calculation result revealed that the parallelism was improved from 100.0 µm to 25.6 µm according to the proposed model. The experimental results showed that the parallelism error reduced from 108.6 µm to 28.2 µm, which was consistent with the calculation results.
publisherThe American Society of Mechanical Engineers (ASME)
titleWhy Parallelism of Workpieces Becomes Convergent During Double-Sided Lapping?
typeJournal Paper
journal volume145
journal issue7
journal titleJournal of Manufacturing Science and Engineering
identifier doi10.1115/1.4057053
journal fristpage74501-1
journal lastpage74501-11
page11
treeJournal of Manufacturing Science and Engineering:;2023:;volume( 145 ):;issue: 007
contenttypeFulltext


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