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contributor authorZhao, Wei
contributor authorWu, Zheyang
contributor authorJi, Songbai
date accessioned2022-02-06T05:35:37Z
date available2022-02-06T05:35:37Z
date copyright6/16/2021 12:00:00 AM
date issued2021
identifier issn0148-0731
identifier otherbio_143_10_101001.pdf
identifier urihttp://yetl.yabesh.ir/yetl1/handle/yetl/4278353
description abstractHead injury model validation has evolved from against pressure to relative brain–skull displacement, and more recently, against marker-based strain. However, there are concerns on strain data quality. In this study, we parametrically investigate how displacement random errors and synchronization errors propagate into strain. Embedded markers from four representative configurations are used to form unique and nonoverlapping tetrahedrons, triangles, and linear elements. Marker displacements are then separately subjected to up to ±10% random displacement errors and up to ±2 ms synchronization errors. Based on 100 random trials in each perturbation test, we find that smaller strain errors relative to the baseline peak strains are significantly associated with larger element sizes (volume, area, or length; p < 0.05). When displacement errors are capped at the two extreme levels, the earlier “column” and “cluster” configurations provide few usable elements with relative strain error under an empirical threshold of 20%, while about 30–80% of elements in recent “repeatable” and “uniform” configurations are considered otherwise usable. Overall, denser markers are desired to provide exhaustive pairwise linear elements with a range of sizes to balance the need for larger elements to minimize strain error but smaller elements to increase the spatial resolution in strain sampling. Their signed strains also provide unique and unambiguous information on tissue tension and compression. This study may provide useful insights into the scrutinization of existing experimental data for head injury model strain validation and to inform how best to design new experiments in the future.
publisherThe American Society of Mechanical Engineers (ASME)
titleDisplacement Error Propagation From Embedded Markers to Brain Strain
typeJournal Paper
journal volume143
journal issue10
journal titleJournal of Biomechanical Engineering
identifier doi10.1115/1.4051050
journal fristpage0101001-1
journal lastpage0101001-10
page10
treeJournal of Biomechanical Engineering:;2021:;volume( 143 ):;issue: 010
contenttypeFulltext


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