| contributor author | Wei, Xinpeng | |
| contributor author | Zhao, Jianxun | |
| contributor author | He, Xiaoming | |
| contributor author | Hu, Zhen | |
| contributor author | Du, Xiaoping | |
| contributor author | Han, Daoru | |
| date accessioned | 2022-02-05T22:11:41Z | |
| date available | 2022-02-05T22:11:41Z | |
| date copyright | 3/9/2021 12:00:00 AM | |
| date issued | 2021 | |
| identifier issn | 2377-2158 | |
| identifier other | vvuq_006_01_011006.pdf | |
| identifier uri | http://yetl.yabesh.ir/yetl1/handle/yetl/4277098 | |
| description abstract | This paper presents an adaptive Kriging based method to perform uncertainty quantification (UQ) of the photoelectron sheath and dust levitation on the lunar surface. The objective of this study is to identify the upper and lower bounds of the electric potential and that of dust levitation height, given the intervals of model parameters in the one-dimensional (1D) photoelectron sheath model. To improve the calculation efficiency, we employ the widely used adaptive Kriging method (AKM). A task-oriented learning function and a stopping criterion are developed to train the Kriging model and customize the AKM. Experiment analysis shows that the proposed AKM is both accurate and efficient. | |
| publisher | The American Society of Mechanical Engineers (ASME) | |
| title | Adaptive Kriging Method for Uncertainty Quantification of the Photoelectron Sheath and Dust Levitation on the Lunar Surface | |
| type | Journal Paper | |
| journal volume | 6 | |
| journal issue | 1 | |
| journal title | Journal of Verification, Validation and Uncertainty Quantification | |
| identifier doi | 10.1115/1.4050073 | |
| journal fristpage | 011006-1 | |
| journal lastpage | 011006-10 | |
| page | 10 | |
| tree | Journal of Verification, Validation and Uncertainty Quantification:;2021:;volume( 006 ):;issue: 001 | |
| contenttype | Fulltext | |
