Altimeter Wind and Wind-Stress Algorithms—Further Refinement and ValidationSource: Journal of Atmospheric and Oceanic Technology:;1994:;volume( 011 ):;issue: 001::page 210Author:Wu, Jin
DOI: 10.1175/1520-0426(1994)011<0210:AWAWSA>2.0.CO;2Publisher: American Meteorological Society
Abstract: An altimeter wind algorithm that was proposed earlier and deduced on the basis of microwave specular reflections from the sea surface is discussed. This algorithm is further tuned overall with buoy-measured winds; it is refined at low winds (<2.4 m s?1) in accordance with the surface-layer characteristics and scatterometer winds, and validated at high winds (>9.6 m s?1) with tower and airborne observations. Recent efforts comparing various altimeter wind algorithms are aim discussed.
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contributor author | Wu, Jin | |
date accessioned | 2017-06-09T17:38:06Z | |
date available | 2017-06-09T17:38:06Z | |
date copyright | 1994/02/01 | |
date issued | 1994 | |
identifier issn | 0739-0572 | |
identifier other | ams-886.pdf | |
identifier uri | http://onlinelibrary.yabesh.ir/handle/yetl/4232283 | |
description abstract | An altimeter wind algorithm that was proposed earlier and deduced on the basis of microwave specular reflections from the sea surface is discussed. This algorithm is further tuned overall with buoy-measured winds; it is refined at low winds (<2.4 m s?1) in accordance with the surface-layer characteristics and scatterometer winds, and validated at high winds (>9.6 m s?1) with tower and airborne observations. Recent efforts comparing various altimeter wind algorithms are aim discussed. | |
publisher | American Meteorological Society | |
title | Altimeter Wind and Wind-Stress Algorithms—Further Refinement and Validation | |
type | Journal Paper | |
journal volume | 11 | |
journal issue | 1 | |
journal title | Journal of Atmospheric and Oceanic Technology | |
identifier doi | 10.1175/1520-0426(1994)011<0210:AWAWSA>2.0.CO;2 | |
journal fristpage | 210 | |
journal lastpage | 215 | |
tree | Journal of Atmospheric and Oceanic Technology:;1994:;volume( 011 ):;issue: 001 | |
contenttype | Fulltext |