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    The Development of a Fine- and Microstructure Profiler

    Source: Journal of Atmospheric and Oceanic Technology:;1988:;volume( 005 ):;issue: 004::page 484
    Author:
    Schmit, Raymond W.
    ,
    Toole, John M.
    ,
    Koehler, Richard L.
    ,
    Mellinger, Edward C.
    ,
    Doherty, Kenneth W.
    DOI: 10.1175/1520-0426(1988)005<0484:TDOAFA>2.0.CO;2
    Publisher: American Meteorological Society
    Abstract: A new freely-falling ocean profiler for measuring finescale variations in temperature, salinity and horizontal velocity and microscale variations in temperature, conductivity, velocity and refractive index has been constructed. The High Resolution Profiler (HRP) features: full ocean depth capability, a microcomputer to control sampling, data storage and operations, solid state mass storage, and commercially available sensors. A special handling rig facilitates deployment and recovery at sea. Because the data are transferred electronically to a microcomputer for archiving, the instrument can be redeployed after use without opening the pressure case. Twenty to forty drops can be made before the battery needs to be replaced. Several different sensor configurations are possible, depending on the type of small-scale mixing process of interest. By observing both finestructure and microstructure with one instrument, it is possible to study the relationship between the finescale driving forces and the small-scale mixing events.
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      The Development of a Fine- and Microstructure Profiler

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    http://yetl.yabesh.ir/yetl1/handle/yetl/4177177
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    contributor authorSchmit, Raymond W.
    contributor authorToole, John M.
    contributor authorKoehler, Richard L.
    contributor authorMellinger, Edward C.
    contributor authorDoherty, Kenneth W.
    date accessioned2017-06-09T15:15:55Z
    date available2017-06-09T15:15:55Z
    date copyright1988/08/01
    date issued1988
    identifier issn0739-0572
    identifier otherams-389.pdf
    identifier urihttp://onlinelibrary.yabesh.ir/handle/yetl/4177177
    description abstractA new freely-falling ocean profiler for measuring finescale variations in temperature, salinity and horizontal velocity and microscale variations in temperature, conductivity, velocity and refractive index has been constructed. The High Resolution Profiler (HRP) features: full ocean depth capability, a microcomputer to control sampling, data storage and operations, solid state mass storage, and commercially available sensors. A special handling rig facilitates deployment and recovery at sea. Because the data are transferred electronically to a microcomputer for archiving, the instrument can be redeployed after use without opening the pressure case. Twenty to forty drops can be made before the battery needs to be replaced. Several different sensor configurations are possible, depending on the type of small-scale mixing process of interest. By observing both finestructure and microstructure with one instrument, it is possible to study the relationship between the finescale driving forces and the small-scale mixing events.
    publisherAmerican Meteorological Society
    titleThe Development of a Fine- and Microstructure Profiler
    typeJournal Paper
    journal volume5
    journal issue4
    journal titleJournal of Atmospheric and Oceanic Technology
    identifier doi10.1175/1520-0426(1988)005<0484:TDOAFA>2.0.CO;2
    journal fristpage484
    journal lastpage500
    treeJournal of Atmospheric and Oceanic Technology:;1988:;volume( 005 ):;issue: 004
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
    yabeshDSpacePersian