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    Radiation Properties and Emissivity Parameterization of High Level Thin Clouds

    Source: Journal of Climate and Applied Meteorology:;1984:;volume( 023 ):;issue: 007::page 1138
    Author:
    Wu, Man-Li C.
    DOI: 10.1175/1520-0450(1984)023<1138:RPAEPO>2.0.CO;2
    Publisher: American Meteorological Society
    Abstract: To parameterize emissivity of clouds at 11 ?m, a study has been made in an effort to understand the radiation field of thin clouds. The contributions to the intensity and flux from different sources and through different physical processes are calculated by using the method of successive orders of scattering. The effective emissivity of thin clouds is decomposed into the effective absorption emissivity, effective scattering emissivity, and effective reflection emissivity. The effective absorption emissivity depends on the absorption and emission of the cloud; it is parameterized in terms of optical thickness. The effective scattering emissivity depends on the scattering properties of the cloud; it is parameterized in terms of optical thickness and single scattering albedo. The effective reflection emissivity follows the similarity relation as in the near infrared cases. This is parameterized in terms of the similarity parameter and optical thickness, as well as the temperature difference between the cloud and ground.
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      Radiation Properties and Emissivity Parameterization of High Level Thin Clouds

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    http://yetl.yabesh.ir/yetl1/handle/yetl/4145903
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    contributor authorWu, Man-Li C.
    date accessioned2017-06-09T14:00:17Z
    date available2017-06-09T14:00:17Z
    date copyright1984/07/01
    date issued1984
    identifier issn0733-3021
    identifier otherams-10751.pdf
    identifier urihttp://onlinelibrary.yabesh.ir/handle/yetl/4145903
    description abstractTo parameterize emissivity of clouds at 11 ?m, a study has been made in an effort to understand the radiation field of thin clouds. The contributions to the intensity and flux from different sources and through different physical processes are calculated by using the method of successive orders of scattering. The effective emissivity of thin clouds is decomposed into the effective absorption emissivity, effective scattering emissivity, and effective reflection emissivity. The effective absorption emissivity depends on the absorption and emission of the cloud; it is parameterized in terms of optical thickness. The effective scattering emissivity depends on the scattering properties of the cloud; it is parameterized in terms of optical thickness and single scattering albedo. The effective reflection emissivity follows the similarity relation as in the near infrared cases. This is parameterized in terms of the similarity parameter and optical thickness, as well as the temperature difference between the cloud and ground.
    publisherAmerican Meteorological Society
    titleRadiation Properties and Emissivity Parameterization of High Level Thin Clouds
    typeJournal Paper
    journal volume23
    journal issue7
    journal titleJournal of Climate and Applied Meteorology
    identifier doi10.1175/1520-0450(1984)023<1138:RPAEPO>2.0.CO;2
    journal fristpage1138
    journal lastpage1147
    treeJournal of Climate and Applied Meteorology:;1984:;volume( 023 ):;issue: 007
    contenttypeFulltext
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    DSpace software copyright © 2002-2015  DuraSpace
    نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
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